SFFS617 September 2025 TPS281C30
The failure mode distribution estimation for TPS281C30x in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| VOUT open (Hi-Z) | 20 |
| VOUT stuck ON to VS | 10 |
| VOUT functional – not in specification voltage or timing | 50 |
| Diagnostics not in specification | 10 |
| Protection function fails to trip | 10 |