SFFS535B September 2022 – September 2025 TPSM33615 , TPSM33625
This section provides a failure mode analysis (FMA) for the pins of the TPSM33625 and TPSM33615. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
| Class | Failure Effects |
|---|---|
| A | Potential device damage that affects functionality. |
| B | No device damage, but loss of functionality. |
| C | No device damage, but performance degradation. |
| D | No device damage, no impact to functionality or performance. |
Figure 4-1 shows the TPSM33625 and TPSM33615 pin diagram. For a detailed description of the device pins, see the Pin Configuration and Functions section in the TPSM33625 and TPSM33615 data sheets.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| PGOOD | 1 | When not in use, this pin can be left grounded (PGOOD is not a valid signal and VOUT is normal). | D |
| EN/UVLO | 2 | VOUT = 0V; part is disabled. | B |
| VIN | 3 | VOUT = 0V. | B |
| VOUT | 4 | Goes into hiccup; short-circuit operation. | B |
| SW | 5 | Device damage. | A |
| 6 | |||
| BOOT | 7 | VOUT = 0V, the high-side FET does not turn on. | B |
| VCC | 8 | Internal circuits are disabled. No output voltage is generated. | B |
| FB | 9 | Switches at maximum duty cycle and VOUT approaches VIN. | B |
| GND | 10 | VOUT normal. | D |
| RT | 11 | Switching frequency is 2.2MHz. | D |
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| PGOOD | 1 | When not in use, this pin can be left open (PGOOD is not a valid signal and VOUT is normal). | D |
| EN/UVLO | 2 | Pin cannot be left floating. | B |
| VIN | 3 | VOUT = 0V. | B |
| VOUT | 4 | Loss of output voltage. | B |
| SW | 5 | Normal operation. | D |
| 6 | |||
| BOOT | 7 | Normal operation. | D |
| VCC | 8 | VCC output is unstable, can increase above 5.5V. | A |
| FB | 9 | Switches at maximum duty cycle and VOUT approaches VIN. Damage to customer load and output stage components are possible. No effect on device. | B |
| GND | 10 | VOUT can be abnormal, as reference voltage is not fixed. | B |
| RT | 11 | If part is RT, frequency is not defined. If part is MODE/SYNC, then part can go back and forth between FPWM and PFM. The part is up and functional. | C |
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|---|
| RT | 11 | PGOOD | If PGOOD is high and < 5.5V, Fsw = 1MHz; if PGOOD is low, Fsw = 2.2MHz. RT or MODE/SYNC absolute maximum is 5.5V. | A |
| PGOOD | 1 | EN/UVLO | If EN > 20V, devices connected to the PGOOD pin are damaged. | A |
| EN/UVLO | 2 | VIN | VOUT normal. | D |
| VIN | 3 | SW | Damage to the low-side FET. | A |
| SW | 5 | BOOT | VOUT = 0V, the high-side does not turn on, no CBOOT. | B |
| 6 | ||||
| BOOT | 7 | VCC | Damage occurs, breaks the VCC pin. | A |
| VCC | 8 | FB | Can be nonfunctional, no damage occurs. | B |
| FB | 9 | GND | Switches at maximum duty cycle and VOUT approaches VIN. | B |
| GND | 10 | RT | VOUT is normal if RT/MODE/SYNC pin is low, otherwise not functional. | D |
| VOUT | 4 | SW | Damage occurs. | A |
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| PGOOD | 1 | If VIN > 20V, damage to PGOOD occurs. | A |
| EN/UVLO | 2 | VOUT normal. | D |
| VIN | 3 | VOUT normal. | D |
| VOUT | 4 | Damage occurs if VIN > 16V. Customer load is damaged. | A |
| SW | 5 | Damage to the low-side FET. | A |
| 6 | |||
| BOOT | 7 | Damage occurs and BOOT ESD clamp is damaged. | A |
| VCC | 8 | If VIN > 5.5V, damage occurs. | A |
| FB | 9 | Damage occurs if VIN > 16V. | A |
| GND | 10 | VOUT = 0V. | B |
| RT | 11 | If VIN > 5.5V, damage occurs. If VIN < 5.5V, switching frequency is 1MHz. | A |