SFFS529 November 2022 TPSF12C1-Q1
This section provides a Failure Mode Analysis (FMA) for the pins of the TPSF12C1-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
| Class | Failure Effects |
|---|---|
| A | Potential device damage that affects functionality |
| B | No device damage, but loss of functionality |
| C | No device damage, but performance degradation |
| D | No device damage, no impact to functionality or performance |
Figure 4-1 shows the TPSF12C1-Q1 pin diagram. For a detailed description of the device pins, please refer to the Pin Configuration and Functions section in the TPSF12C1-Q1 data sheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| NC | 1, 3, 12 | No impact | D |
| VDD | 2 | AEF disabled | B |
| SENSE1A | 4 | AEF degradation | B |
| SENSE1B | 5 | AEF degradation | B |
| SENSE2A | 6 | AEF degradation | B |
| SENSE2B | 7 | AEF degradation | B |
| EN | 8 | AEF disabled | B |
| REFGND | 9 | Normal operation | D |
| COMP1 | 10 | No EMI filtering | B |
| COMP2 | 11 | No EMI filtering; damage to gain stage | A |
| INJ | 13 | No EMI filtering; damage to gain stage | A |
| IGND | 14 | Normal operation | D |
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| NC | 1, 3, 12 | No effect (normal operation) | D |
| VDD | 2 | No EMI filtering | B |
| SENSE1A | 4 | AEF degradation | B |
| SENSE1B | 5 | AEF degradation | B |
| SENSE2A | 6 | AEF degradation | B |
| SENSE2B | 7 | AEF degradation | B |
| EN | 8 | No effect (normal operation) | B |
| REFGND | 9 | AEF degradation | B |
| COMP1 | 10 | No EMI filtering | B |
| COMP2 | 11 | No EMI filtering | B |
| INJ | 13 | No EMI filtering | B |
| IGND | 14 | AEF degradation | B |
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|---|
| NC | 1 | VDD | No effect (normal operation) | D |
| VDD | 2 | NC | No effect (normal operation) | D |
| NC | 3 | SENSE1 | No effect (normal operation) | B |
| SENSE1A | 4 | SENSE1B | No effect (normal operation) | B |
| SENSE1B | 5 | SENSE2A | AEF degradation | B |
| SENSE2A | 6 | SENSE2B | No effect (normal operation) | B |
| SENSE2B | 7 | EN | N/A | D |
| EN | 8 | REFGND | No EMI filtering | B |
| REFGND | 9 | COMP1 | No EMI filtering | B |
| COMP1 | 10 | COMP2 | No EMI filtering | B |
| COMP2 | 11 | NC | No effect (normal operation) | D |
| NC | 12 | INJ | No effect (normal operation) | D |
| INJ | 13 | IGND | No EMI filtering; damage to gain stage | A |
| IGND | 14 | NC | No effect (normal operation) | D |
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| NC | 1, 3, 12 | No effect (normal operation) | D |
| VDD | 2 | No effect (normal operation) | D |
| SENSE1A | 4 | AEF degradation; damage to sensing stage | A |
| SENSE1B | 5 | AEF degradation; damage to sensing stage | A |
| SENSE2A | 6 | AEF degradation; damage to sensing stage | A |
| SENSE2B | 7 | AEF degradation; damage to sensing stage | A |
| EN | 8 | AEF normal | B |
| REFGND | 9 | AEF disabled | B |
| COMP1 | 10 | No EMI filtering; damage to COMP1 if VVDD > 5.5 V | A |
| COMP2 | 11 | No EMI filtering; damage to COMP2 if VVDD > 15 V | A |
| INJ | 13 | No EMI filtering; damage to gain stage | A |
| IGND | 14 | AEF disabled | B |