SFFS529 November 2022 TPSF12C1-Q1
The failure mode distribution estimation for the TPSF12C1-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution |
|---|---|
| INJ open (high impedance) | 32% |
| INJ saturated high | 6% |
| INJ saturated low | 7% |
| INJ functional but not in specification | 55% |