SFFS302 October 2021 SN74LVC1G3157-Q1
This section provides a Failure Mode Analysis (FMA) for the pins of the SN74LVC1G3157-Q1 (DBV and DCK package). The failure modes covered in this document include the following typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device per the failure effects classification in Table 4-1.
| Class | Failure Effects |
|---|---|
| A | Potential device damage that affects functionality |
| B | No device damage, but loss of functionality |
| C | No device damage, but performance degradation |
| D | No device damage, no impact to functionality or performance |