SFFS301 May 2025 LM74720-Q1
The failure mode distribution estimation for LM74720-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| GATE output functional, not in specification voltage or timing | 18 |
| GATE stuck at high | 11 |
| GATE stuck at low | 18 |
| PD output functional, not in specification voltage or timing | 12 |
| PD stuck at high | 6 |
| PD stuck at low | 21 |
| OV fails to trip or false trip | 9 |
| Pin-to-pin short | 5 |