This tab is informational only. There
are no selections the user can make in this tab.
The 'Totals - ISO26262' tab contains
the results of the chip level FMEDA metrics based on the selections in the previous
tabs. This tab summarizes the metrics as described by the ISO 26262 functional
safety standard. The top table breaks out the overall FIT and diagnostic coverage
for permanent faults of the die, transient faults of the die, package faults, and
finally the overall sum of faults for each row. The following information is
provided:
- Total FIT (Raw FIT): The total
base failure rate of the device using the described base FIT model under the
environmental conditions input in the 'Mission Profile Tailoring' tab.
- Safety related FIT: A subset of
the total FIT that includes only the design blocks or device pins that are
indicated as safety related on the 'Pin Level Tailoring' and 'Function and Diag
Tailoring' tabs.
- Probabilistic Metrics for random
Hardware Failures (PMHF) (in FIT): The selection of diagnostics in the 'Pin
Level Tailoring' and 'Function and Diag Tailoring' tabs directly impact this
percentage.
- Single Point Fault Metric - SPFM:
The percentage coverage for detecting or preventing single point faults.
- Latent Fault Metric - LFM: The
percentage coverage for detecting or preventing latent faults.
There are also some intermediate
calculations based on the terms in the ISO 26262 standard:
- Total faults (λ)
- Total safety related faults
(λSR)
- Total non safety related faults
(λnSR)
- Total safe faults
(λS)
- Total not safe faults
(λnS).
- Total faults with prob. of
violate the SG (λPVSG)
- Total single point faults
(λSPF)
- Total residual faults (λRF)
- Total multi point (primary)
[non-PVSG] (λMPFPrimary)
- Total multi point (secondary)
[PVSG] (λMPFSecondary)
- Total multi point detected faults
(λMPF_det)
- Total multi point latent faults
(λMPF,l)
The concept of perceived faults is not
applicable at the semiconductor level since the fault detection ability of the
driver cannot be considered at this level of analysis.