SFFS059 January 2023 DRV8145-Q1
This section provides Functional Safety Failure In Time (FIT) rates for DRV8145-Q1 based on two different industry-wide used reliability standards:
| FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) | ||
|---|---|---|---|
| SPI "P" variant in HTSSOP package | HW variant in VQFN-HR package | SPI "S" variant in VQFN-HR package | |
| Total Component FIT Rate | 27 | 25 | 25 |
| Die FIT Rate | 8 | 13 | 13 |
| Package FIT Rate | 19 | 12 | 12 |
The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
| Table | Category | Reference FIT Rate | Reference Virtual TJ |
|---|---|---|---|
| 5 | CMOS,BICMOS Digital, analog / mixed | 25 FIT | 55°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.