SFFS059 January 2023 DRV8145-Q1
Figure 4-3shows the pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the DRV8145-Q1 data sheet.
Figure 4-3 SPI "S" variant| Pin | Description of Potential Failure Effect(s) | Failure Effect Class | |
|---|---|---|---|
| No. | Name | ||
| 1 | nFAULT | False fault signaling possible. Device will continue to operate as commanded. | B |
| 2 | IPROPI | IPROPI feedback is lost. ITRIP regulation, if enabled, is also lost. | B |
| 3 | nSLEEP | Device will be in SLEEP state and OUT is Hi-Z | B |
| 4 | VM | Device is powered off with driver Hi-Z. | B |
| 5, 6 | OUT | If OUT is commanded to be pulled high, short is detected and OUT is Hi-Z. | B |
| 7 | GND | Normal function. | D |
| 8,9 | OUT | If OUT is commanded to be pulled high, short is detected and OUT is Hi-Z. | B |
| 10 | VCP | Device damage possible. Device behavior can not be guaranteed. | A |
| 11 | DRVOFF | Pin based shutoff function is lost. | B |
| 12 | IN | External PWM control is lost. Internal ITRIP regulation is ok. No risk of spin direction reversal. | B |
| 13 | nSCS | SPI communication is lost. | B |
| 14 | SCLK | SPI communication is lost. | B |
| 15 | SDI | SPI communication is lost. | B |
| 16 | SDO | SPI communication is lost. | B |
| Pin | Description of Potential Failure Effect(s) | Failure Effect Class | |
|---|---|---|---|
| No. | Name | ||
| 1 | nFAULT | False fault signaling possible. Device will continue to operate as commanded. | B |
| 2 | IPROPI | IPROPI feedback is lost. Load will be forced to recirculate if ITRIP regulation is enabled. | B |
| 3 | nSLEEP | Device will be in SLEEP state and OUT is Hi-Z. | B |
| 4 | VM | Device is powered off with driver Hi-Z. | B |
| 5, 6 | OUT | Load drive capability is lost. | B |
| 7 | GND | Normal function. | D |
| 8,9 | OUT | Load drive capability is lost. | B |
| 10 | VCP | The driver can't keep up with PWM frequency > 20 KHz | B |
| 11 | DRVOFF | Pin based shutoff is triggered and OUT is Hi-Z | B |
| 12 | IN | External PWM control is lost. Internal ITRIP regulation is OK. No risk of spin direction reversal. | B |
| 13 | nSCS | SPI communication is lost. | B |
| 14 | SCLK | SPI communication is lost. | B |
| 15 | SDI | SPI communication is lost. | B |
| 16 | SDO | SPI communication is lost. | B |
| Short between pins | Description of Potential Failure Effect(s) | Failure Effect Class | |
|---|---|---|---|
| nFAULT | SDO | False fault signaling possible. SPI communication will be affected during fault assertion. | B |
| IPROPI | nFAULT | False fault signaling possible. IPROPI feedback is inaccurate. ITRIP regulation levels, if enabled, will be lower. | B |
| nSLEEP | IPROPI | ITRIP regulation levels, if enabled, will be lower. | B |
| VM | nSLEEP | SLEEP functionality is lost. | B |
| OUT | VM | If OUT is commanded to be pulled low, short is detected and OUT is Hi-Z. | B |
| GND | OUT | If OUT is commanded to be pulled high, short is detected and OUT is Hi-Z. | B |
| VCP | VM | Pull up path RON (High-side FET) will be much higher. | B |
| DRVOFF | VCP | Device damage possible. Device behavior can not be guaranteed. | A |
| IN | DRVOFF | Either OUT is Hi-Z or external PWM control is lost. Internal ITRIP regulation is ok. No risk of spin direction reversal. | B |
| nSCS | IN | SPI communication is affected. External PWM control is lost. Internal ITRIP regulation is OK. No risk of spin direction reversal. | B |
| SCLK | nSCS | SPI communication is lost. | B |
| SDI | SCLK | SPI communication is lost. | B |
| SDO | SDI | SPI communication is lost. | B |
| Pin | Description of Potential Failure Effect(s) | Failure Effect Class | |
|---|---|---|---|
| No. | Name | ||
| 1 | nFAULT | Device damage possible. | A |
| 2 | IPROPI | Device damage possible. | A |
| 3 | nSLEEP | SLEEP functionality is lost. | B |
| 4 | VM | Device is powered off with driver Hi-Z. | B |
| 5, 6 | OUT | If OUT is commanded to be pulled low, short is detected and OUT is Hi-Z. | B |
| 7 | GND | Normal function. | D |
| 8,9 | OUT | If OUT is commanded to be pulled low, short is detected and OUT is Hi-Z. | B |
| 10 | VCP | Pull up path RON (High-side FET) will be much higher. | B |
| 11 | DRVOFF | OUT is Hi-Z. | B |
| 12 | IN | Device damage possible. | A |
| 13 | nSCS | Device damage possible. | A |
| 14 | SCLK | Device damage possible. | A |
| 15 | SDI | Device damage possible. | A |
| 16 | SDO | Device damage possible. | A |