SBVA072A December 2020 – January 2021 TPS3703-Q1
The failure mode distribution estimation for TPS3703-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| nRESET fails to trip | 15% |
| nRESET false trip | 15% |
| nRESET trip outside specification (voltage or time) | 65% |
| nRESET delay outside specification | 5% |