SBOK075 October 2023 SN54SC245-SEP
PRODUCTION DATA
3 Test Device and Test Board Information
The SN54SC245-SEP is a packaged 20-pin, TSSOP plastic package as shown in the pinout diagram in Figure 3-1. Figure 3-2 shows the device with the package cap decapped to reveal the die for heavy ion testing. Figure 3-3 shows the evaluation board used for radiation testing. Figure 3-4 shows the bias diagram used for Single-Event Latch-up (SEL) testing.
Figure 3-1 SN54SC245-SEP Pinout
Diagram
Figure 3-2 SN54SC245-SEP with
Decapped Package
Figure 3-3 SN54SC245-SEP Evaluation
Board (Top View)
Figure 3-4 SN54SC245-SEP SEL Bias
Diagram
Figure 3-5 SN54SC245-SEP Thermal Image
for SEL