SBOK073 august 2023 TRF0206-SP
PRODUCTION DATA
A step-stress (3 krad(Si), 10 krad(Si), 30 krad(Si), 50 krad(Si), 100 krad(Si)) test method was used to determine the TID hardness level. That is, after a predetermined TID level was reached, an electrical test was performed on a given sample of parts to verify that the units are within specified the SMD electrical test limits. MIL-STD-883, Test Method 1019.9, Condition A and Condition D was used in this case.
The following tables (Table 2-1 through Table 2-4) list the serialized samples that were used during the RHA characterization.
| HDR = 263 rad(Si)/s | ||||
|---|---|---|---|---|
| Total Samples: 5 unbiased/TID level | ||||
| Exposure Levels: | ||||
| 3 krad(Si) | 10 krad(Si) | 30 krad(Si) | 50 krad(Si) | 100 krad(Si) |
| 61, 62, 71, 72, 93 | 26, 36, 45, 80, 92 | 17, 35, 47, 59 | 10, 37, 43, 66, 88 | 3, 7, 28, 77, 86 |
| HDR = 263 rad(Si)/s | ||||
|---|---|---|---|---|
| Total Samples: 5 biased/TID level | ||||
| Exposure Levels: | ||||
| 3 krad(Si) | 10 krad(Si) | 30 krad(Si) | 50 krad(Si) | 100 krad(Si) |
| 6, 18, 31, 41, 51 | 63, 73, 83, 84, 94 | 4, 5, 16, 46, 57, 69 | 25, 30, 33, 56, 81 | 11, 15, 60, 79, 85 |
| LDR = 0.01 rad(Si)/s | ||||
|---|---|---|---|---|
| Total Samples: 5 unbiased/TID level | ||||
| Exposure Levels: | ||||
| 3 krad(Si) | 10 krad(Si) | 30 krad(Si) | 50 krad(Si) | 100 krad(Si) |
| 201, 202, 206, 207, 208 | 201, 202, 206, 207, 208 | 201, 202, 206, 207, 208 | 201, 202, 206, 207, 208 | 201, 202, 206, 207, 208 |
| LDR = 0.01 rad(Si)/s | ||||
|---|---|---|---|---|
| Total Samples: 5 biased/TID level | ||||
| Exposure Levels: | ||||
| 3 krad(Si) | 10 krad(Si) | 30 krad(Si) | 50 krad(Si) | 100 krad(Si) |
| 179, 180, 181, 182, 200 | 179, 180, 181, 182, 200 | 179, 180, 181, 182, 200 | 179, 180, 181, 182, 200 | 6, 7, 8, 18, 26 |