ZHCSX03F December 2002 – June 2024 ULQ2003A-Q1 , ULQ2004A-Q1
PRODUCTION DATA
- 1
- 1 特性
- 2 應用
- 3 說明
- 4 Pin Configuration and Functions
-
5 Specifications
- 5.1 Absolute Maximum Ratings
- 5.2 ESD Ratings
- 5.3 Recommended Operating Conditions
- 5.4 Thermal Information
- 5.5 Electrical Characteristics, ULQ2003AT and ULQ2003AQ
- 5.6 Electrical Characteristics, ULQ2004AT
- 5.7 Switching Characteristics, ULQ2003A and ULQ2004A
- 5.8 Dissipation Ratings
- 5.9 Typical Characteristics
- 6 Parameter Measurement Information
- 7 Detailed Description
- 8 Application and Implementation
- 9 Device and Documentation Support
- 10Revision History
- 11Mechanical, Packaging, and Orderable Information
6 Parameter Measurement Information
Figure 6-1 ICEX Test Circuit
Figure 6-2 ICEX Test Circuit
Figure 6-3 II(off) Test Circuit
Figure 6-4 II Test Circuit
Figure 6-5 IR Test Circuit
Figure 6-6 VF Test Circuit
A. II is fixed for
measuring VCE(sat), variable for measuring hFE.
Figure 6-7 hFE, VCE(sat) Test Circuit
Figure 6-8 VI(on) Test Circuit
Figure 6-9 Propagation Delay-Time Waveforms
A. The pulse generator has the
following characteristics: PRR = 12.5 kHz, ZO = 50 ?.
B. CL includes probe and
jig capacitance.
C. For testing the ULQ2003A,
VIH = 3 V; for the ULQ2004A, VIH = 8 V.
Figure 6-10 Latch-Up
Test Circuit and Voltage Waveforms