ZHCSQ75C June 2022 – March 2023 UCC28C50-Q1 , UCC28C51-Q1 , UCC28C52-Q1 , UCC28C53-Q1 , UCC28C54-Q1 , UCC28C55-Q1 , UCC28C56H-Q1 , UCC28C56L-Q1 , UCC28C57H-Q1 , UCC28C57L-Q1 , UCC28C58-Q1 , UCC28C59-Q1
PRODUCTION DATA
- 1 特性
- 2 應用
- 3 說明
- 4 Revision History
- 5 Device Comparison Table
- 6 Pin Configuration and Functions
- 7 Specifications
-
8 Detailed Description
- 8.1 Overview
- 8.2 Functional Block Diagram
- 8.3 Feature Description
- 8.4 Device Functional Modes
-
9 Application and Implementation
- 9.1 Application Information
- 9.2
Typical Application
- 9.2.1 Design Requirements
- 9.2.2
Detailed Design Procedure
- 9.2.2.1 Primary-to-Secondary Turns Ratio of the Flyback Transformer (NPS)
- 9.2.2.2 Primary Magnetizing Inductance of the Flyback Transformer (LM)
- 9.2.2.3 Number of Turns of the Flyback Transformer Windings
- 9.2.2.4 Current Sense Resistors (R24, R25) and Current Limiting
- 9.2.2.5 Primary Clamp Circuit (D7, D1, D3, R2, R28) to Limit Voltage Stress
- 9.2.2.6 Primary-Side Current Stress and Input Capacitor Selection
- 9.2.2.7 Secondary-Side Current Stress and Output Capacitor Selection
- 9.2.2.8 VDD Capacitors (C12, C18)
- 9.2.2.9 Gate Drive Network (R14, R16, Q6)
- 9.2.2.10 VREF Capacitor (C18)
- 9.2.2.11 RT/CT Components (R12, C15)
- 9.2.2.12 HV Start-Up Circuitry for VDD (Q1, Q2, D2, D4, D6, D8, R5)
- 9.2.2.13 Desensitization to CS-pin Noise by RC Filtering, Leading-Edge Blanking, and Slope Compensation
- 9.2.2.14 Voltage Feedback Compensation
- 9.2.3 Application Curves
- 9.3 PCB Layout Recommendations
- 9.4 Power Supply Recommendations
- 10Device and Documentation Support
- 11Mechanical, Packaging, and Orderable Information
10.6 靜電放電警告
 |
靜電放電 (ESD) 會損壞這個集成電路。德州儀器 (TI) 建議通過適當的預防措施處理所有集成電路。如果不遵守正確的處理和安裝程序，可能會損壞集成電路。 |
| ESD 的損壞小至導致微小的性能降級，大至整個器件故障。精密的集成電路可能更容易受到損壞，這是因為非常細微的參數更改都可能會導致器件與其發布的規格不相符。 |