ZHCSNG0A April 2023 – April 2024 TPS929160-Q1
PRODUCTION DATA
- 1
- 1 特性
- 2 應用
- 3 說明
- 4 Pin Configuration and Functions
- 5 Specifications
-
6 Detailed Description
- 6.1 Overview
- 6.2 Functional Block Diagram
- 6.3
Feature Description
- 6.3.1 Device Bias and Power
- 6.3.2 Constant Current Output
- 6.3.3 PWM Dimming
- 6.3.4 FAIL-SAFE State Operation
- 6.3.5 On-Chip, 8-Bit, Analog-to-Digital Converter (ADC)
- 6.3.6 NSTB Output
- 6.3.7
Diagnostic and Protection in NORMAL State
- 6.3.7.1 VBAT Undervoltage Lockout Diagnostics in NORMAL state
- 6.3.7.2 Low-Supply Warning Diagnostics in NORMAL State
- 6.3.7.3 Supply Undervoltage Diagnostics in NORMAL State
- 6.3.7.4 Reference Diagnostics in NORMAL state
- 6.3.7.5 Pre-Thermal Warning in NORMAL state
- 6.3.7.6 Overtemperature Protection in NORMAL state
- 6.3.7.7 Overtemperature Shutdown in NORMAL state
- 6.3.7.8 LED Open-Circuit Diagnostics in NORMAL state
- 6.3.7.9 LED Short-Circuit Diagnostics in NORMAL state
- 6.3.7.10 Single-LED Short-Circuit Detection in NORMAL state
- 6.3.7.11 EEPROM CRC Error in NORMAL state
- 6.3.7.12 Communication Loss Diagnostic in NORMAL state
- 6.3.7.13 Fault Masking in NORMAL state
- 55
- 6.3.8
Diagnostic and Protection in FAIL-SAFE states
- 6.3.8.1 Supply Undervoltage Lockout Diagnostics in FAIL-SAFE states
- 6.3.8.2 Low-Supply Warning Diagnostics in FAIL-SAFE states
- 6.3.8.3 Supply Undervoltage Diagnostics in FAIL-SAFE State
- 6.3.8.4 Reference Diagnostics in FAIL-SAFE states
- 6.3.8.5 Pre-Thermal Warning in FAIL-SAFE state
- 6.3.8.6 Overtemperature Protection in FAIL-SAFE state
- 6.3.8.7 Overtemperature Shutdown in FAIL-SAFE state
- 6.3.8.8 LED Open-Circuit Diagnostics in FAIL-SAFE state
- 6.3.8.9 LED Short-Circuit Diagnostics in FAIL-SAFE state
- 6.3.8.10 Single-LED Short-Circuit Detection in FAIL-SAFE state
- 6.3.8.11 EEPROM CRC Error in FAIL-SAFE state
- 6.3.8.12 Fault Masking in FAIL-SAFE state
- 69
- 6.3.9 OFAF Setup In FAIL-SAFE state
- 6.3.10 ERR Output
- 6.4 Device Functional Modes
- 6.5 Programming
- 6.6 Register Maps
- 7 Application and Implementation
- 8 Device and Documentation Support
- 9 Revision History
- 10Mechanical, Packaging, and Orderable Information
封裝選項
請參考 PDF 數據表獲取器件具體的封裝圖。
機械數據 (封裝 | 引腳)
- DCP|38
散熱焊盤機械數據 (封裝 | 引腳)
- DCP|38
訂購信息
6.3.7.4 Reference Diagnostics in NORMAL state
The TPS929160-Q1 integrates diagnostics for REF resistor open and short fault. The device monitors the reference current I(REF) set by external resistor R(REF). The I(REF) can be calculated with the following equation.
where
- V(REF) = 1.235 V typically
If the current output from REF pin I(REF) is lower than I(REF_OPEN_th), the reference resistor open-circuit fault is reported. The reference resistor short-circuit fault is reported if the voltage of REF pin V(REF) is lower than V(REF_SHORT_th). The device pulls the ERR pin down with constant current sink and set flag registers including FLAG_REF and FLAG_ERR to 1.
The fault is latched in flag registers. After the REF pin I(REF) and V(REF) recover to normal, the device releases ERR pin pulldown automatically and the master controller must send CLRFAULT to clear FLAG_REF and FLAG_ERR. The CLRFAULT automatically returns to 0.
In NORMAL state, the device does not perform any actions automatically when the reference resistor fault is detected. However, the output can not work properly and the output current can be operating at high current level. TI recommends for master controller to shut down the device outputs and report error to upper level control system such as Body Control Module (BCM).