ZHCSHB7B September 2017 – July 2018 TPS7A53-Q1
PRODUCTION DATA.
- 1 特性
- 2 應用
- 3 說明
- 4 修訂歷史記錄
- 5 Pin Configuration and Functions
- 6 Specifications
- 7 Detailed Description
-
8 Application and Implementation
- 8.1
Application Information
- 8.1.1 Recommended Capacitor Types
- 8.1.2 Soft Start and Inrush Current
- 8.1.3 Optimizing Noise and PSRR
- 8.1.4 Charge Pump Noise
- 8.1.5 Current Sharing
- 8.1.6 Adjustable Operation
- 8.1.7 Power-Good Operation
- 8.1.8 Undervoltage Lockout (UVLO) Operation
- 8.1.9 Dropout Voltage (VDO)
- 8.1.10 Device Behavior During Transition From Dropout Into Regulation
- 8.1.11 Load Transient Response
- 8.1.12 Reverse Current Protection Considerations
- 8.1.13 Power Dissipation (PD)
- 8.1.14 Estimating Junction Temperature
- 8.2 Typical Application
- 8.1
Application Information
- 9 Power Supply Recommendations
- 10Layout
- 11器件和文檔支持
- 12機械、封裝和可訂購信息
封裝選項
機械數據 (封裝 | 引腳)
散熱焊盤機械數據 (封裝 | 引腳)
- RGR|20
訂購信息
11.6 靜電放電警告
ESD 可能會損壞該集成電路。德州儀器 (TI) 建議通過適當的預防措施處理所有集成電路。如果不遵守正確的處理措施和安裝程序 , 可能會損壞集成電路。
ESD 的損壞小至導致微小的性能降級 , 大至整個器件故障。 精密的集成電路可能更容易受到損壞 , 這是因為非常細微的參數更改都可能會導致器件與其發布的規格不相符。