ZHCSSZ6F august 2008 – june 2020 TPS40210-Q1 , TPS40211-Q1
PRODUCTION DATA
- 1
- 1 特性
- 2 應用
- 3 說明
- 5
- 4 Revision History
- 5 Pin Configuration and Functions
- 6 Specifications
-
7 Detailed Description
- 7.1 Overview
- 7.2 Functional Block Diagram
- 7.3
Feature Description
- 7.3.1 Minimum On-Time and Off-Time Considerations
- 7.3.2 Current Sense and Overcurrent
- 7.3.3 Current Sense and Subharmonic Instability
- 7.3.4 Current Sense Filtering
- 7.3.5 Soft Start
- 7.3.6 BP Regulator
- 7.3.7 Shutdown (DIS/ EN Pin)
- 7.3.8 Control Loop Considerations
- 7.3.9 Gate Drive Circuit
- 7.3.10 TPS40211-Q1
- 7.4 Device Functional Modes
-
8 Application and Implementation
- 8.1 Application Information
- 8.2
Typical Application
- 8.2.1 Design Requirements
- 8.2.2
Detailed Design Procedure
- 8.2.2.1 Duty Cycle Estimation
- 8.2.2.2 Inductor Selection
- 8.2.2.3 Rectifier Diode Selection
- 8.2.2.4 Output Capacitor Selection
- 8.2.2.5 Input Capacitor Selection
- 8.2.2.6 Current Sense and Current Limit
- 8.2.2.7 Current Sense Filter
- 8.2.2.8 Switching MOSFET Selection
- 8.2.2.9 Feedback Divider Resistors
- 8.2.2.10 Error Amplifier Compensation
- 8.2.2.11 R-C Oscillator
- 8.2.2.12 Soft-Start Capacitor
- 8.2.2.13 Regulator Bypass
- 8.2.3 Application Curves
- 9 Power Supply Recommendations
- 10Layout
- 11Device and Documentation Support
- 12Mechanical, Packaging, and Orderable Information
11.7 靜電放電警告
 |
靜電放電 (ESD) 會損壞這個集成電路。德州儀器 (TI) 建議通過適當的預防措施處理所有集成電路。如果不遵守正確的處理和安裝程序，可能會損壞集成電路。 |
| ESD 的損壞小至導致微小的性能降級，大至整個器件故障。精密的集成電路可能更容易受到損壞，這是因為非常細微的參數更改都可能會導致器件與其發布的規格不相符。 |