ZHCSK92E September 2019 – March 2022 TPS25840-Q1 , TPS25842-Q1
PRODUCTION DATA
The device features an active-low, open-drain fault output. Connect a 100-kΩ pullup resistor from FAULT to VCC or other suitable I/O voltage. FAULT can be left open or tied to GND when not used.
Table 10-4 summarizes the conditions that generate a fault and actions taken by the device.
| EVENT | CONDITION | ACTION |
|---|---|---|
| Overcurrent on OUT | NFET or Buck average current limit implemented. See Current Limit Sensing using RILIMIT.
ICSN/OUT > programmed ISNS. | The device regulates current at ISNS either by external NFET or by the buck
regulator control loop. When current limiting by external NFET, there is NO fault indicator assertion under minor overload conditions. When current limiting by buck average current, there is NO fault indicator assertion under minor overload conditions. Hard shorts during average buck current limiting can trigger buck hiccup operation. The FAULT indicator asserts immediately after NOC cycles in and persists for TOC as specified in Cycle-by-Cycle Buck Current Limit. |
| Overvoltage on BUS | VBUS > VBUS_OV | The device turns on the BUS discharge path in the event of an overvoltage conditions and turns off the LS_GD immediately. The FAULT indicator asserts and de-asserts with an 8-ms deglitch. |
| Overvoltage on the data lines | DP_IN or DM_IN > VDx_IN_OV | The device immediately shuts off the USB data switches. The FAULT indicator asserts and de-asserts with an 8-ms deglitch. |