8 Revision History
Changes from Revision E (December 2019) to Revision F (May 2025)
Changes from Revision D (April 2016) to Revision E (December 2019)
- Changed the Pin Configuration image appearanceGo
- Changed the titles of Figure 6-4 and Figure 6-5
Go
Changes from Revision C (April 2016) to Revision D (April 2016)
- 將將
節 2
列表中的 ARNIC825 更改為 ARINC825Go
Changes from Revision B (April 2016) to Revision C (April 2016)
- Removed the Preview Note from TCAN337 and TCAN337G in the Device Options tableGo
Changes from Revision A (January 2016) to Revision B (April 2016)
- Removed the Preview Note from all device except for TCAN337 and TCAN337G in the Device Comparison tableGo
- Changed FAULT Pin ICL MIN value From: 5mA To: 4mA in the
Section 5.5
Go
Changes from Revision * (December 2015) to Revision A (January 2016)
- 將
節 1
從“總環路延遲 < 150ns” 至：“總環路延遲 < 135ns”Go
- Changed VIT(SLEEP) To: VIT(STB) and added Test conditions in the
Section 5.5
Go
- Added –12V < VCM < 12V to tWK_FILTER in the Test
Conditions of
Section 5.6
Go