ZHCSIQ6B September 2018 – August 2021 LM5176-Q1
PRODUCTION DATA
- 1 特性
- 2 應(yīng)用
- 3 說明
- 4 Revision History
- 5 Pin Configuration and Functions
- 6 Specifications
-
7 Detailed Description
- 7.1 Overview
- 7.2 Functional Block Diagram
- 7.3
Feature Description
- 7.3.1 Fixed Frequency Valley/Peak Current Mode Control with Slope Compensation
- 7.3.2 VCC Regulator and Optional BIAS Input
- 7.3.3 Enable/UVLO
- 7.3.4 Soft-Start
- 7.3.5 Overcurrent Protection
- 7.3.6 Average Input/Output Current Limiting
- 7.3.7 Operation Above 40-V Input
- 7.3.8 CCM Operation
- 7.3.9 Frequency and Synchronization (RT/SYNC)
- 7.3.10 Frequency Dithering
- 7.3.11 Output Overvoltage Protection (OVP)
- 7.3.12 Power Good (PGOOD)
- 7.3.13 Gm Error Amplifier
- 7.3.14 Integrated Gate Drivers
- 7.3.15 Thermal Shutdown
- 7.4 Device Functional Modes
-
8 Application and Implementation
- 8.1 Application Information
- 8.2
Typical Application
- 8.2.1 Design Requirements
- 8.2.2
Detailed Design Procedure
- 8.2.2.1 Custom Design with WEBENCH Tools
- 8.2.2.2 Frequency
- 8.2.2.3 VOUT
- 8.2.2.4 Inductor Selection
- 8.2.2.5 Output Capacitor
- 8.2.2.6 Input Capacitor
- 8.2.2.7 Sense Resistor (RSENSE)
- 8.2.2.8 Slope Compensation
- 8.2.2.9 UVLO
- 8.2.2.10 Soft-Start Capacitor
- 8.2.2.11 Dither Capacitor
- 8.2.2.12 MOSFETs QH1 and QL1
- 8.2.2.13 MOSFETs QH2 and QL2
- 8.2.2.14 Frequency Compensation
- 8.2.3 Application Curves
- 9 Power Supply Recommendations
- 10Layout
- 11Device and Documentation Support
- 12Mechanical, Packaging, and Orderable Information
封裝選項(xiàng)
機(jī)械數(shù)據(jù) (封裝 | 引腳)
- PWP|28
散熱焊盤機(jī)械數(shù)據(jù) (封裝 | 引腳)
- PWP|28
訂購信息
11.6 Electrostatic Discharge Caution
 |
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. |
| ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. |