TLV5638-EP

正在供貨

具有可編程內(nèi)部基準(zhǔn)電壓和穩(wěn)定時(shí)間的增強(qiáng)型產(chǎn)品 12 位、1us 串行輸入、雙路 DAC

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功能與比較器件相似
DAC63002 正在供貨 具有 Hi-Z、EEPROM 和波形發(fā)生器的 12 位、雙通道低功耗電壓/電流輸出智能 DAC Low power with VOUT and IOUT and smaller package

產(chǎn)品詳情

Resolution (Bits) 12 Number of DAC channels 2 Interface type SPI Output type Buffered Voltage Output voltage range (V) 0 to 5 INL (max) (±LSB) 4 Settling time (μs) 1 Reference type Ext, Int Architecture String Rating HiRel Enhanced Product Sample/update rate (Msps) 0.233 Power consumption (typ) (mW) 4.5 Operating temperature range (°C) -55 to 125 Product type General-purpose DAC
Resolution (Bits) 12 Number of DAC channels 2 Interface type SPI Output type Buffered Voltage Output voltage range (V) 0 to 5 INL (max) (±LSB) 4 Settling time (μs) 1 Reference type Ext, Int Architecture String Rating HiRel Enhanced Product Sample/update rate (Msps) 0.233 Power consumption (typ) (mW) 4.5 Operating temperature range (°C) -55 to 125 Product type General-purpose DAC
SOIC (D) 8 29.4 mm2 4.9 x 6
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree
  • Dual 12-Bit Voltage Output DAC
  • Programmable Internal Reference
  • Programmable Settling Time:
       1 μs in Fast Mode,
       3.5 μs in Slow Mode
  • Compatible With TMS320 and SPI? Serial Ports
  • Differential Nonlinearity <0.5 LSB Typ
  • Monotonic Over Temperature
  • applications
    • Digital Servo Control Loops
    • Digital Offset and Gain Adjustment
    • Industrial Process Control
    • Machine and Motion Control Devices
    • Mass Storage Devices

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
SPI and QSPI are trademarks of Motorola, Inc.
Microwire is a trademark of National Semiconductor Corporation.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree
  • Dual 12-Bit Voltage Output DAC
  • Programmable Internal Reference
  • Programmable Settling Time:
       1 μs in Fast Mode,
       3.5 μs in Slow Mode
  • Compatible With TMS320 and SPI? Serial Ports
  • Differential Nonlinearity <0.5 LSB Typ
  • Monotonic Over Temperature
  • applications
    • Digital Servo Control Loops
    • Digital Offset and Gain Adjustment
    • Industrial Process Control
    • Machine and Motion Control Devices
    • Mass Storage Devices

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
SPI and QSPI are trademarks of Motorola, Inc.
Microwire is a trademark of National Semiconductor Corporation.

The TLV5638 is a dual 12-bit voltage output DAC with a flexible 3-wire serial interface. The serial interface allows glueless interface to TMS320 and SPI™, QSPI™, and Microwire™ serial ports. It is programmed with a 16-bit serial string containing 4 control and 12 data bits.

The resistor string output voltage is buffered by a x2 gain rail-to-rail output buffer. The buffer features a Class AB output stage to improve stability and reduce settling time. The programmable settling time of the DAC allows the designer to optimize speed vs power dissipation. With its on-chip programmable precision voltage reference, the TLV5638 simplifies overall system design.

Because of its ability to source up to 1 mA, the reference can also be used as a system reference. Implemented with a CMOS process, the device is designed for single supply operation from 2.7 V to 5.5 V. It is available in an 8-pin SOIC package to reduce board space.

The TLV5638 is a dual 12-bit voltage output DAC with a flexible 3-wire serial interface. The serial interface allows glueless interface to TMS320 and SPI™, QSPI™, and Microwire™ serial ports. It is programmed with a 16-bit serial string containing 4 control and 12 data bits.

The resistor string output voltage is buffered by a x2 gain rail-to-rail output buffer. The buffer features a Class AB output stage to improve stability and reduce settling time. The programmable settling time of the DAC allows the designer to optimize speed vs power dissipation. With its on-chip programmable precision voltage reference, the TLV5638 simplifies overall system design.

Because of its ability to source up to 1 mA, the reference can also be used as a system reference. Implemented with a CMOS process, the device is designed for single supply operation from 2.7 V to 5.5 V. It is available in an 8-pin SOIC package to reduce board space.
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頂層文檔 類型 標(biāo)題 格式選項(xiàng) 下載最新的英語版本 日期
* 輻射與可靠性報(bào)告 TLV5638MDREP Reliability Report 2014年 12月 22日
* 數(shù)據(jù)表 2.7V-5.5V Low-Power Dual 12By Digital-To-Analog Converter w/Int Ref & Power Down 數(shù)據(jù)表 (Rev. B) 2003年 12月 5日

訂購和質(zhì)量

包含信息：
  • RoHS
  • REACH
  • 器件標(biāo)識(shí)
  • 引腳鍍層/焊球材料
  • MSL 等級(jí)/回流焊峰值溫度
  • MTBF/時(shí)基故障估算
  • 材料成分
  • 鑒定摘要
  • 持續(xù)可靠性監(jiān)測
包含信息：
  • 制造廠地點(diǎn)
  • 封裝廠地點(diǎn)

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