TLV5614-EP

正在供貨

具有串行輸入、可編程建立時(shí)間、低功耗、硬件或軟件電源關(guān)閉功能的四通道 DAC（增強(qiáng)型產(chǎn)品）

可提供此產(chǎn)品的更新版本

功能與比較器件相同，但引腳排列有所不同
DAC60504 正在供貨 采用微型 QFN 封裝、具有精密內(nèi)部基準(zhǔn)電壓的真正 12 位、4 通道、SPI、電壓輸出 DAC 12-bit resolution with internal reference

產(chǎn)品詳情

Resolution (Bits) 12 Number of DAC channels 4 Interface type SPI Output type Buffered Voltage Output voltage range (V) 0 to 5 INL (max) (±LSB) 4 Settling time (μs) 3 Reference type Ext Architecture String Rating HiRel Enhanced Product Sample/update rate (Msps) 0.102 Power consumption (typ) (mW) 3.6 Operating temperature range (°C) -55 to 125 Product type General-purpose DAC
Resolution (Bits) 12 Number of DAC channels 4 Interface type SPI Output type Buffered Voltage Output voltage range (V) 0 to 5 INL (max) (±LSB) 4 Settling time (μs) 3 Reference type Ext Architecture String Rating HiRel Enhanced Product Sample/update rate (Msps) 0.102 Power consumption (typ) (mW) 3.6 Operating temperature range (°C) -55 to 125 Product type General-purpose DAC
TSSOP (PW) 16 32 mm2 5 x 6.4
  • Controlled Baseline
    • One Assembly
    • One Test Site
    • One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • Four 12-Bit Digital-to-Analog Converters (DACs)
  • Programmable Settling Time of Either 3 μs or 9 μs (Typ)
  • TMS320? DSP Family, (Q)SPI?, and Microwire? Compatible Serial Interface
  • Internal Power-On Reset
  • Low Power Consumption:
      8 mW, Slow Mode - 5-V Supply
      3.6 mW, Slow Mode - 3-V Supply
  • Reference Input Buffer
  • Voltage Output Range . . . 2× the Reference Input Voltage
  • Monotonic Overtemperature
  • Dual 2.7-V to 5.5-V Supply (Separate Digital and Analog Supplies)
  • Hardware Power Down (10 nA)
  • Software Power Down (10 nA)
  • Simultaneous Update
  • applications
    • Battery-Powered Test Instruments
    • Digital Offset and Gain Adjustment
    • Industrial Process Controls
    • Machine and Motion Control Devices
    • Communications
    • Arbitrary Waveform Generation

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

TMS320 is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
  • Controlled Baseline
    • One Assembly
    • One Test Site
    • One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • Four 12-Bit Digital-to-Analog Converters (DACs)
  • Programmable Settling Time of Either 3 μs or 9 μs (Typ)
  • TMS320? DSP Family, (Q)SPI?, and Microwire? Compatible Serial Interface
  • Internal Power-On Reset
  • Low Power Consumption:
      8 mW, Slow Mode - 5-V Supply
      3.6 mW, Slow Mode - 3-V Supply
  • Reference Input Buffer
  • Voltage Output Range . . . 2× the Reference Input Voltage
  • Monotonic Overtemperature
  • Dual 2.7-V to 5.5-V Supply (Separate Digital and Analog Supplies)
  • Hardware Power Down (10 nA)
  • Software Power Down (10 nA)
  • Simultaneous Update
  • applications
    • Battery-Powered Test Instruments
    • Digital Offset and Gain Adjustment
    • Industrial Process Controls
    • Machine and Motion Control Devices
    • Communications
    • Arbitrary Waveform Generation

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

TMS320 is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.

The TLV5614 is a quadruple 12-bit voltage output digital-to-analog converter (DAC) with a flexible four-wire serial interface. The four-wire serial interface allows glueless interface to TMS320™ DSP family, SPI™, QSPI™, and Microwire™ serial ports. The TLV5614 is programmed with a 16-bit serial word comprised of a DAC address, individual DAC control bits, and a 12-bit DAC value. The device has provision for two supplies - one digital supply for the serial interface (via pins DVDD and DGND), and one for the DACs, reference buffers, and output buffers (via pins AVDD and AGND). Each supply is independent of the other and can be any value between 2.7 V and 5.5 V. The dual supplies allow a typical application where the DAC is controlled via a microprocessor operating on a 3-V supply (also used on pins DVDD and DGND), with the DACs operating on a 5-V supply. The digital and analog supplies can be tied together.

The resistor string output voltage is buffered by a 2× gain rail-to-rail output buffer. The buffer features a Class AB output stage to improve stability and reduce settling time. A rail-to-rail output stage and a power-down mode makes it ideal for single-voltage, battery-based applications. The settling time of the DAC is programmable to allow the designer to optimize speed versus power dissipation. The settling time is chosen by the control bits within the 16-bit serial input string. A high-impedance buffer is integrated on the REFINAB and REFINCD terminals to reduce the need for a low source-impedance drive to the terminal. REFINAB and REFINCD allow DAC A and B to have a different reference voltage than DAC C and D.

The TLV5614 is implemented with a CMOS process and is available in a 16-terminal TSSOP package. The TLV5614M is characterized for operation from -55°C to 125°C.

The TLV5614 is a quadruple 12-bit voltage output digital-to-analog converter (DAC) with a flexible four-wire serial interface. The four-wire serial interface allows glueless interface to TMS320™ DSP family, SPI™, QSPI™, and Microwire™ serial ports. The TLV5614 is programmed with a 16-bit serial word comprised of a DAC address, individual DAC control bits, and a 12-bit DAC value. The device has provision for two supplies - one digital supply for the serial interface (via pins DVDD and DGND), and one for the DACs, reference buffers, and output buffers (via pins AVDD and AGND). Each supply is independent of the other and can be any value between 2.7 V and 5.5 V. The dual supplies allow a typical application where the DAC is controlled via a microprocessor operating on a 3-V supply (also used on pins DVDD and DGND), with the DACs operating on a 5-V supply. The digital and analog supplies can be tied together.

The resistor string output voltage is buffered by a 2× gain rail-to-rail output buffer. The buffer features a Class AB output stage to improve stability and reduce settling time. A rail-to-rail output stage and a power-down mode makes it ideal for single-voltage, battery-based applications. The settling time of the DAC is programmable to allow the designer to optimize speed versus power dissipation. The settling time is chosen by the control bits within the 16-bit serial input string. A high-impedance buffer is integrated on the REFINAB and REFINCD terminals to reduce the need for a low source-impedance drive to the terminal. REFINAB and REFINCD allow DAC A and B to have a different reference voltage than DAC C and D.

The TLV5614 is implemented with a CMOS process and is available in a 16-terminal TSSOP package. The TLV5614M is characterized for operation from -55°C to 125°C.
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* 數(shù)據(jù)表 TLV5614-EP 數(shù)據(jù)表 2006年 4月 5日

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包含信息：
  • RoHS
  • REACH
  • 器件標(biāo)識(shí)
  • 引腳鍍層/焊球材料
  • MSL 等級(jí)/回流焊峰值溫度
  • MTBF/時(shí)基故障估算
  • 材料成分
  • 鑒定摘要
  • 持續(xù)可靠性監(jiān)測(cè)
包含信息：
  • 制造廠地點(diǎn)
  • 封裝廠地點(diǎn)

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