SN74F573

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具有三態(tài)輸出的八通道透明 D 型鎖存器

產品詳情

Number of channels 8 Technology family F Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 Input type Bipolar Output type 3-State Clock frequency (max) (MHz) 70 IOL (max) (mA) 24 IOH (max) (mA) -3 Supply current (max) (μA) 55000 Features Flow-through pinout, Very high speed (tpd 5-10ns) Operating temperature range (°C) 0 to 70 Rating Catalog
Number of channels 8 Technology family F Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 Input type Bipolar Output type 3-State Clock frequency (max) (MHz) 70 IOL (max) (mA) 24 IOH (max) (mA) -3 Supply current (max) (μA) 55000 Features Flow-through pinout, Very high speed (tpd 5-10ns) Operating temperature range (°C) 0 to 70 Rating Catalog
PDIP (N) 20 228.702 mm2 24.33 x 9.4 SOIC (DW) 20 131.84 mm2 12.8 x 10.3
  • Eight Latches in a Single Package
  • 3-State Bus-Driving True Outputs
  • Full Parallel Access for Loading
  • Buffered Control Inputs
  • Package Options Include Plastic Small-Outline Packages, Ceramic Chip Carriers, and Standard Plastic and Ceramic 300-mil DIPs
  • Eight Latches in a Single Package
  • 3-State Bus-Driving True Outputs
  • Full Parallel Access for Loading
  • Buffered Control Inputs
  • Package Options Include Plastic Small-Outline Packages, Ceramic Chip Carriers, and Standard Plastic and Ceramic 300-mil DIPs

These 8-bit latches feature 3-state outputs designed specifically for driving highly capacitive or relatively low-impedance loads. They are particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.

The eight latches of the ´F573 are transparent D-type latches. While the latch enable (LE) input is high, the Q outputs follow the data (D) inputs. When the latch enable is taken low, the Q outputs are latched at the logic levels set up at the D inputs.

A buffered output enable input can be used to place the eight outputs in either a normal logic state (high or low logic levels) or a high- impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and increased drive provide the capability to drive bus lines without need for interface or pullup components.

The output enable input does not affect the internal operations of the latches. Old data can be retained or new data can be entered while the outputs are in the high-impedance state.

The SN54F573 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74F573 is characterized for operation from 0°C to 70°C.

 

 

These 8-bit latches feature 3-state outputs designed specifically for driving highly capacitive or relatively low-impedance loads. They are particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.

The eight latches of the ´F573 are transparent D-type latches. While the latch enable (LE) input is high, the Q outputs follow the data (D) inputs. When the latch enable is taken low, the Q outputs are latched at the logic levels set up at the D inputs.

A buffered output enable input can be used to place the eight outputs in either a normal logic state (high or low logic levels) or a high- impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and increased drive provide the capability to drive bus lines without need for interface or pullup components.

The output enable input does not affect the internal operations of the latches. Old data can be retained or new data can be entered while the outputs are in the high-impedance state.

The SN54F573 is characterized for operation over the full military temperature range of -55°C to 125°C. The SN74F573 is characterized for operation from 0°C to 70°C.

 

 

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類型 標題 下載最新的英語版本 日期
* 數(shù)據表 Octal Transparent D-Type Latches With 3-State Outputs 數(shù)據表 (Rev. A) 1993年 10月 1日

訂購和質量

包含信息:
  • RoHS
  • REACH
  • 器件標識
  • 引腳鍍層/焊球材料
  • MSL 等級/回流焊峰值溫度
  • MTBF/時基故障估算
  • 材料成分
  • 鑒定摘要
  • 持續(xù)可靠性監(jiān)測
包含信息:
  • 制造廠地點
  • 封裝廠地點

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