SN74BCT760-EP

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具有集電極開(kāi)路輸出的 8 通道、-0.5V 至 7V 緩沖器（增強(qiáng)型產(chǎn)品）

產(chǎn)品詳情

Technology family BCT Supply voltage (min) (V) -0.5 Supply voltage (max) (V) 7 Number of channels 8 IOL (max) (mA) 76 Supply current (max) (μA) 76 IOH (max) (mA) 0 Input type Bipolar Output type Open-collector Features High speed (tpd 10-50ns), Over-voltage tolerant inputs Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
Technology family BCT Supply voltage (min) (V) -0.5 Supply voltage (max) (V) 7 Number of channels 8 IOL (max) (mA) 76 Supply current (max) (μA) 76 IOH (max) (mA) 0 Input type Bipolar Output type Open-collector Features High speed (tpd 10-50ns), Over-voltage tolerant inputs Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
SOIC (DW) 20 131.84 mm2 12.8 x 10.3
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • Open-Collector Version of 'BCT244
  • Open-Collector Outputs Drive Bus Lines or Buffer Memory Address Registers
  • ESD Protection Exceeds 2000 V Per MIL-STD-883C Method 3015
  • Available In Plastic Small-Outline (DW) Package

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified >performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • Open-Collector Version of 'BCT244
  • Open-Collector Outputs Drive Bus Lines or Buffer Memory Address Registers
  • ESD Protection Exceeds 2000 V Per MIL-STD-883C Method 3015
  • Available In Plastic Small-Outline (DW) Package

(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified >performance and environmental limits.

The SN74BCT760 octal buffer and line driver is designed specifically to improve both the performance and density of 3-state memory address drivers, clock drivers, and bus-oriented receivers and transmitters.

The SN74BCT760 is organized as two 4-bit buffers/line drivers with separate output-enable (OE) inputs. When OE is low, the device passes data from the A inputs to the Y outputs. When OE is high, the outputs are in the high-impedance state.

The device is characterized for operation over the full military temperature range of -55°C to 125°C.

The SN74BCT760 octal buffer and line driver is designed specifically to improve both the performance and density of 3-state memory address drivers, clock drivers, and bus-oriented receivers and transmitters.

The SN74BCT760 is organized as two 4-bit buffers/line drivers with separate output-enable (OE) inputs. When OE is low, the device passes data from the A inputs to the Y outputs. When OE is high, the outputs are in the high-impedance state.

The device is characterized for operation over the full military temperature range of -55°C to 125°C.

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* 數(shù)據(jù)表 SN74BCT760-EP 數(shù)據(jù)表 (Rev. B) 2006年 9月 7日

訂購(gòu)和質(zhì)量

包含信息：
  • RoHS
  • REACH
  • 器件標(biāo)識(shí)
  • 引腳鍍層/焊球材料
  • MSL 等級(jí)/回流焊峰值溫度
  • MTBF/時(shí)基故障估算
  • 材料成分
  • 鑒定摘要
  • 持續(xù)可靠性監(jiān)測(cè)
包含信息：
  • 制造廠地點(diǎn)
  • 封裝廠地點(diǎn)

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