SN74AUP3G17
- Available in the Texas Instruments NanoStar? Package
- Low Static-Power Consumption (ICC = 0.9 μA Maximum)
- Low Dynamic-Power Consumption (Cpd = 4.3 pF Typ at 3.3 V)
- Low Input Capacitance (Ci = 1.5 pF Typical)
- Low Noise — Overshoot and Undershoot
<10% of VCC - Ioff Supports Partial-Power-Down Mode Operation
- Wide Operating VCC Range of 0.8 V to 3.6 V
- Optimized for 3.3-V Operation
- 3.6-V I/O Tolerant to Support Mixed-Mode Signal Operation
- tpd = 5.1 ns Maximum at 3.3 V
- Suitable for Point-to-Point Applications
- Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
- ESD Performance Tested Per JESD 22
- 2000-V Human-Body Model
(A114-B, Class II) - 1000-V Charged-Device Model (C101)
- 2000-V Human-Body Model
NanoStar Is a trademark of Texas Instruments
The AUP family is TIs premier solution to the industrys low-power needs in battery-powered portable applications. This family ensures a very low static- and dynamic-power consumption across the entire VCC range of 0.8 V to 3.6 V, resulting in increased battery life. This product also maintains excellent signal integrity.
The SN74LVC3G17 contains three buffers and performs the Boolean function Y = A. The device functions as three independent buffers but, because of Schmitt action, it may have different input threshold levels for positive-going (VT+) and negative-going (VT) signals.
NanoStar™ package technology is a major breakthrough in IC packaging concepts, using the die as the package.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs, preventing damaging current backflow through the device when it is powered down.
技術(shù)文檔
| 類型 | 標(biāo)題 | 下載最新的英語版本 | 日期 | |||
|---|---|---|---|---|---|---|
| * | 數(shù)據(jù)表 | SN74AUP3G17 Low-Power Triple Schmitt-Trigger Buffer 數(shù)據(jù)表 (Rev. C) | 2010年 1月 17日 | |||
| 應(yīng)用簡報(bào) | 了解施密特觸發(fā)器 (Rev. B) | PDF | HTML | 英語版 (Rev.B) | PDF | HTML | 2025年 5月 5日 | |
| 選擇指南 | Little Logic Guide 2018 (Rev. G) | 2018年 7月 6日 | ||||
| 選擇指南 | Logic Guide (Rev. AB) | 2017年 6月 12日 | ||||
| 應(yīng)用手冊 | How to Select Little Logic (Rev. A) | 2016年 7月 26日 | ||||
| 選擇指南 | 邏輯器件指南 2014 (Rev. AA) | 最新英語版本 (Rev.AC) | PDF | HTML | 2014年 11月 17日 | ||
| 選擇指南 | 小尺寸邏輯器件指南 (Rev. E) | 最新英語版本 (Rev.G) | 2012年 7月 16日 | |||
| 應(yīng)用手冊 | Semiconductor Packing Material Electrostatic Discharge (ESD) Protection | 2004年 7月 8日 | ||||
| 選擇指南 | Logic Guide (Rev. AC) | PDF | HTML | 1994年 6月 1日 |
設(shè)計(jì)和開發(fā)
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5-8-LOGIC-EVM — 支持 5 至 8 引腳 DCK、DCT、DCU、DRL 和 DBV 封裝的通用邏輯評估模塊
| 封裝 | 引腳 | CAD 符號(hào)、封裝和 3D 模型 |
|---|---|---|
| DSBGA (YFP) | 8 | Ultra Librarian |
| UQFN (RSE) | 8 | Ultra Librarian |
| VSSOP (DCU) | 8 | Ultra Librarian |
| X2SON (DQE) | 8 | Ultra Librarian |
訂購和質(zhì)量
- RoHS
- REACH
- 器件標(biāo)識(shí)
- 引腳鍍層/焊球材料
- MSL 等級(jí)/回流焊峰值溫度
- MTBF/時(shí)基故障估算
- 材料成分
- 鑒定摘要
- 持續(xù)可靠性監(jiān)測
- 制造廠地點(diǎn)
- 封裝廠地點(diǎn)