SN74AHCU04-EP
- Controlled Baseline
- One Assembly Site
- One Test Site
- One Fabrication Site
- Extended Temperature Performance of -55°C to 125°C
- Enhanced Diminishing Manufacturing Sources (DMS) Support
- Enhanced Product-Change Notification
- Qualification Pedigree(1)
- Operating Range 2-V to 5.5-V VCC
- Unbuffered Outputs
- Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
- ESD Protection Exceeds JESD 22
- 2000-V Human-Body Model (A114-A)
- 200-V Machine Model (A115-A)
- 1000-V Charged-Device Model (C101)
(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
The HC04 devices contain six independent inverters. They perform the Boolean function Y = A in positive logic.
技術文檔
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查看全部 1 | 頂層文檔 | 類型 | 標題 | 格式選項 | 下載最新的英語版本 | 日期 | |
|---|---|---|---|---|---|---|
| * | 數據表 | Hex Inverter 數據表 | 2007年 3月 21日 |
訂購和質量
包含信息:
- RoHS
- REACH
- 器件標識
- 引腳鍍層/焊球材料
- MSL 等級/回流焊峰值溫度
- MTBF/時基故障估算
- 材料成分
- 鑒定摘要
- 持續(xù)可靠性監(jiān)測
包含信息:
- 制造廠地點
- 封裝廠地點