SN74AHCT541-EP

正在供貨

具有 TTL 兼容型 CMOS 輸入的 8 通道、4.5V 至 5.5V 緩沖器（增強(qiáng)型產(chǎn)品）

產(chǎn)品詳情

Technology family AHCT Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 Number of channels 8 IOL (max) (mA) 8 Supply current (max) (μA) 20 IOH (max) (mA) -8 Input type TTL-Compatible CMOS Output type Push-Pull Features Balanced outputs, Over-voltage tolerant inputs, Very high speed (tpd 5-10ns) Rating HiRel Enhanced Product Operating temperature range (°C) -40 to 85
Technology family AHCT Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 Number of channels 8 IOL (max) (mA) 8 Supply current (max) (μA) 20 IOH (max) (mA) -8 Input type TTL-Compatible CMOS Output type Push-Pull Features Balanced outputs, Over-voltage tolerant inputs, Very high speed (tpd 5-10ns) Rating HiRel Enhanced Product Operating temperature range (°C) -40 to 85
SOIC (DW) 20 131.84 mm2 12.8 x 10.3
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • Inputs Are TTL-Voltaage Compatible
  • Latch-Up Performance Exceeds 250 mA Per JESD 17
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • Inputs Are TTL-Voltaage Compatible
  • Latch-Up Performance Exceeds 250 mA Per JESD 17
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The SN74AHCT541 octal buffer/driver is ideal for driving bus lines or buffer memory address registers. This device features inputs and outputs on opposite sides of the package to facilitate printed circuit board layout.

The 3-state control gate is a 2-input AND gate with active-low inputs so that if either output-enable (OE1\ or OE2\) input is high, all corresponding outputs are in the high-impedance state. The outputs provide noninverted data when they are not in the high-impedance state.

To ensure the high-impedance state during power up or power down, OE\ should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

The SN74AHCT541 octal buffer/driver is ideal for driving bus lines or buffer memory address registers. This device features inputs and outputs on opposite sides of the package to facilitate printed circuit board layout.

The 3-state control gate is a 2-input AND gate with active-low inputs so that if either output-enable (OE1\ or OE2\) input is high, all corresponding outputs are in the high-impedance state. The outputs provide noninverted data when they are not in the high-impedance state.

To ensure the high-impedance state during power up or power down, OE\ should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.
下載 觀看帶字幕的視頻 視頻

技術(shù)文檔

star =有關(guān)此產(chǎn)品的 TI 精選熱門(mén)文檔
未找到結(jié)果。請(qǐng)清除搜索并重試。
查看全部 23
頂層文檔 類型 標(biāo)題 格式選項(xiàng) 下載最新的英語(yǔ)版本 日期
* 數(shù)據(jù)表 SN74AHCT541-EP 數(shù)據(jù)表 2004年 9月 28日
* 輻射與可靠性報(bào)告 SN74AHCT541-EP Reliability Report 2018年 3月 19日
* VID SN74AHCT541-EP VID V6204761 2016年 6月 21日
選擇指南 Logic Guide (Rev. AC) PDF | HTML 2025年 11月 13日
應(yīng)用手冊(cè) 慢速或浮點(diǎn) CMOS 輸入的影響 (Rev. E) PDF | HTML 英語(yǔ)版 (Rev.E) 2025年 3月 26日
選擇指南 Little Logic Guide 2018 (Rev. G) 2018年 7月 6日
應(yīng)用手冊(cè) How to Select Little Logic (Rev. A) 2016年 7月 26日
應(yīng)用手冊(cè) Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015年 12月 2日
選擇指南 邏輯器件指南 2014 (Rev. AA) 最新英語(yǔ)版本 (Rev.AC) PDF | HTML 2014年 11月 17日
選擇指南 小尺寸邏輯器件指南 (Rev. E) 最新英語(yǔ)版本 (Rev.G) 2012年 7月 16日
用戶指南 LOGIC Pocket Data Book (Rev. B) 2007年 1月 16日
應(yīng)用手冊(cè) 選擇正確的電平轉(zhuǎn)換解決方案 (Rev. A) 英語(yǔ)版 (Rev.A) 2006年 3月 23日
產(chǎn)品概述 Design Summary for WCSP Little Logic (Rev. B) 2004年 11月 4日
應(yīng)用手冊(cè) Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004年 7月 8日
應(yīng)用手冊(cè) Advanced High-Speed CMOS (AHC) Logic Family (Rev. C) 2002年 12月 2日
應(yīng)用手冊(cè) Texas Instruments Little Logic Application Report 2002年 11月 1日
應(yīng)用手冊(cè) TI IBIS File Creation, Validation, and Distribution Processes 2002年 8月 29日
設(shè)計(jì)指南 AHC/AHCT Designer's Guide February 2000 (Rev. D) 2000年 2月 24日
產(chǎn)品概述 Military Advanced High-Speed CMOS Logic (AHC/AHCT) (Rev. C) 1998年 4月 1日
應(yīng)用手冊(cè) Migration From 3.3-V To 2.5-V Power Supplies For Logic Devices 1997年 12月 1日
應(yīng)用手冊(cè) Bus-Interface Devices With Output-Damping Resistors Or Reduced-Drive Outputs (Rev. A) 1997年 8月 1日
應(yīng)用手冊(cè) CMOS Power Consumption and CPD Calculation (Rev. B) 1997年 6月 1日
應(yīng)用手冊(cè) Live Insertion 1996年 10月 1日

設(shè)計(jì)與開(kāi)發(fā)

如需其他信息或資源，請(qǐng)點(diǎn)擊以下任一標(biāo)題進(jìn)入詳情頁(yè)面查看（如有）。

封裝 引腳 CAD 符號(hào)、封裝和 3D 模型
SOIC (DW) 20 Ultra Librarian

訂購(gòu)和質(zhì)量

包含信息：
  • RoHS
  • REACH
  • 器件標(biāo)識(shí)
  • 引腳鍍層/焊球材料
  • MSL 等級(jí)/回流焊峰值溫度
  • MTBF/時(shí)基故障估算
  • 材料成分
  • 鑒定摘要
  • 持續(xù)可靠性監(jiān)測(cè)
包含信息：
  • 制造廠地點(diǎn)
  • 封裝廠地點(diǎn)

支持和培訓(xùn)

可獲得 TI 工程師技術(shù)支持的 TI E2E? 論壇

所有內(nèi)容均由 TI 和社區(qū)貢獻(xiàn)者按“原樣”提供，并不構(gòu)成 TI 規(guī)范。請(qǐng)參閱使用條款。

如果您對(duì)質(zhì)量、包裝或訂購(gòu) TI 產(chǎn)品有疑問(wèn)，請(qǐng)參閱 TI 支持。??????????????

視頻