單通道 2 輸入、2V 至 5.5V 或非門（增強(qiáng)型產(chǎn)品）

產(chǎn)品詳情

Technology family AHC Number of channels 1 Supply voltage (min) (V) 2 Supply voltage (max) (V) 5.5 Inputs per channel 2 IOL (max) (mA) 50 IOH (max) (mA) -50 Output type Push-Pull Input type Standard CMOS Features Over-voltage tolerant inputs, Very high speed (tpd 5-10ns) Data rate (max) (Mbps) 110 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
Technology family AHC Number of channels 1 Supply voltage (min) (V) 2 Supply voltage (max) (V) 5.5 Inputs per channel 2 IOL (max) (mA) 50 IOH (max) (mA) -50 Output type Push-Pull Input type Standard CMOS Features Over-voltage tolerant inputs, Very high speed (tpd 5-10ns) Data rate (max) (Mbps) 110 Rating HiRel Enhanced Product Operating temperature range (°C) -55 to 125
SOT-SC70 (DCK) 5 4.2 mm2 2 x 2.1
  • Controlled Baseline
    • One Assembly Site
    • One Test Site
    • One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • Operating Range of 2 V to 5.5 V
  • Max tpd of 8.5 ns at 5 V
  • Low Power Consumption, 10 μA Max ICC
  • ±8 mA Output Drive at 5 V
  • Schmitt Trigger Action at All Inputs Makes the Circuit Tolerant for Slower Input Rise and Fall Time
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly Site
    • One Test Site
    • One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree(1)
  • Operating Range of 2 V to 5.5 V
  • Max tpd of 8.5 ns at 5 V
  • Low Power Consumption, 10 μA Max ICC
  • ±8 mA Output Drive at 5 V
  • Schmitt Trigger Action at All Inputs Makes the Circuit Tolerant for Slower Input Rise and Fall Time
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

This device contains a single 2-input NOR gate that performs the Boolean function Y = A • B or Y = A + B in positive logic.

This device contains a single 2-input NOR gate that performs the Boolean function Y = A • B or Y = A + B in positive logic.
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* 數(shù)據(jù)表 Single 2-Input Positive-NOR Gate 數(shù)據(jù)表 2008年 2月 20日

訂購(gòu)和質(zhì)量

包含信息：
  • RoHS
  • REACH
  • 器件標(biāo)識(shí)
  • 引腳鍍層/焊球材料
  • MSL 等級(jí)/回流焊峰值溫度
  • MTBF/時(shí)基故障估算
  • 材料成分
  • 鑒定摘要
  • 持續(xù)可靠性監(jiān)測(cè)
包含信息：
  • 制造廠地點(diǎn)
  • 封裝廠地點(diǎn)