SN74ACT534

正在供貨

具有三態(tài)輸出的八通道邊沿觸發(fā)式 D 型觸發(fā)器

產(chǎn)品詳情

Number of channels 8 Technology family ACT Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 Input type TTL-Compatible CMOS Output type 3-State Clock frequency (max) (MHz) 90 IOL (max) (mA) 24 IOH (max) (mA) -24 Supply current (max) (μA) 40 Features Balanced outputs, Positive input clamp diode, Very high speed (tpd 5-10ns) Operating temperature range (°C) -40 to 85 Rating Catalog
Number of channels 8 Technology family ACT Supply voltage (min) (V) 4.5 Supply voltage (max) (V) 5.5 Input type TTL-Compatible CMOS Output type 3-State Clock frequency (max) (MHz) 90 IOL (max) (mA) 24 IOH (max) (mA) -24 Supply current (max) (μA) 40 Features Balanced outputs, Positive input clamp diode, Very high speed (tpd 5-10ns) Operating temperature range (°C) -40 to 85 Rating Catalog
PDIP (N) 20 228.702 mm2 24.33 x 9.4 SOIC (DW) 20 131.84 mm2 12.8 x 10.3 SOP (NS) 20 98.28 mm2 12.6 x 7.8 TSSOP (PW) 20 41.6 mm2 6.5 x 6.4
  • 4.5-V to 5.5-V VCC Operation
  • Inputs Accept Voltages to 5.5 V
  • Max tpd of 10.5 ns at 5 V
  • Inputs Are TTL-Voltage Compatible
  • 3-State Inverting Outputs Drive Bus Lines Directly
  • Full Parallel Access for Loading

  • 4.5-V to 5.5-V VCC Operation
  • Inputs Accept Voltages to 5.5 V
  • Max tpd of 10.5 ns at 5 V
  • Inputs Are TTL-Voltage Compatible
  • 3-State Inverting Outputs Drive Bus Lines Directly
  • Full Parallel Access for Loading

These octal edge-triggered D-type flip-flops feature 3-state outputs designed specifically for driving highly capacitive or relatively low-impedance loads. The devices are particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.

On the positive transition of the clock (CLK) input, the Q\ outputs are set to the complements of the logic levels set up at the data (D) inputs.

A buffered output-enable (OE)\ input can be used to place the eight outputs in either a normal logic state (high or low logic levels) or the high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and increased drive provide the capability to drive bus lines without need for interface or pullup components.

OE\ does not affect internal operations of the flip-flops. Old data can be retained or new data can be entered while the outputs are in the high-impedance state.

To ensure the high-impedance state during power up or power down, OE\ should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

These octal edge-triggered D-type flip-flops feature 3-state outputs designed specifically for driving highly capacitive or relatively low-impedance loads. The devices are particularly suitable for implementing buffer registers, I/O ports, bidirectional bus drivers, and working registers.

On the positive transition of the clock (CLK) input, the Q\ outputs are set to the complements of the logic levels set up at the data (D) inputs.

A buffered output-enable (OE)\ input can be used to place the eight outputs in either a normal logic state (high or low logic levels) or the high-impedance state. In the high-impedance state, the outputs neither load nor drive the bus lines significantly. The high-impedance state and increased drive provide the capability to drive bus lines without need for interface or pullup components.

OE\ does not affect internal operations of the flip-flops. Old data can be retained or new data can be entered while the outputs are in the high-impedance state.

To ensure the high-impedance state during power up or power down, OE\ should be tied to VCC through a pullup resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

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類型 標(biāo)題 下載最新的英語版本 日期
* 數(shù)據(jù)表 SN54ACT534, SN74ACT534 數(shù)據(jù)表 (Rev. C) 2002年 11月 1日

訂購和質(zhì)量

包含信息:
  • RoHS
  • REACH
  • 器件標(biāo)識(shí)
  • 引腳鍍層/焊球材料
  • MSL 等級(jí)/回流焊峰值溫度
  • MTBF/時(shí)基故障估算
  • 材料成分
  • 鑒定摘要
  • 持續(xù)可靠性監(jiān)測(cè)
包含信息:
  • 制造廠地點(diǎn)
  • 封裝廠地點(diǎn)

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