SN65LVDS95-EP
- Controlled Baseline
- One Assembly/Test Site, One Fabrication Site
- Enhanced Diminishing Manufacturing
Sources (DMS) Support - Enhanced Product-Change Notification
- Qualification Pedigree

- 21:3 Data Channel Compression at up to
1.36 Gigabits per Second Throughput - Suited for Point-to-Point Subsystem
Communication With Very Low EMI - 21 Data Channels Plus Clock in
Low-Voltage TTL and 3 Data Channels Plus
Clock Out Low-Voltage Differential - Operates From a Single 3.3-V Supply and
250 mW (Typ) - 5-V Tolerant Data Inputs
- ’LVDS95 Has Rising Clock Edge Triggered Inputs
- Bus Pins Tolerate 6-kV HBM ESD
- Packaged in Thin Shrink Small-Outline
Package With 20 Mil Terminal Pitch - Consumes <1 mW When Disabled
- Wide Phase-Lock Input Frequency Range
20 MHz to 68 MHz - No External Components Required for PLL
- Inputs Meet or Exceed the Requirements of
ANSI EIA/TIA-644 Standard - Industrial Temperature Qualified
TA = –40°C to 85°C - Replacement for the National DS90CR215
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
The SN65LVDS95 LVDS serdes (serializer/deserializer) transmitter contains three 7-bit parallel-load serial-out shift registers, a 7× clock synthesizer, and four low-voltage differential signaling (LVDS) line drivers in a single integrated circuit. These functions allow 21 bits of single-ended LVTTL data to be synchronously transmitted over 4 balanced-pair conductors for receipt by a compatible receiver, such as the SN65LVDS96.
When transmitting, data bits D0 through D20 are each loaded into registers of the SN65LVDS95 on the rising edge of the input clock signal (CLKIN). The frequency of CLKIN is multiplied seven times and then used to serially unload the data registers in 7-bit slices. The three serial streams and a phase-locked clock (CLKOUT) are then output to LVDS output drivers. The frequency of CLKOUT is the same as the input clock, CLKIN.
The SN65LVDS95 requires no external components and little or no control. The data bus appears the same at the input to the transmitter and output of the receiver with data transmission transparent to the user(s). The only user intervention is the possible use of the shutdown/clear (SHTDN) active-low input to inhibit the clock and shut off the LVDS output drivers for lower power consumption. A low level on this signal clears all internal registers to a low level.
技術(shù)文檔
| 頂層文檔 | 類型 | 標(biāo)題 | 格式選項(xiàng) | 下載最新的英語版本 | 日期 | |
|---|---|---|---|---|---|---|
| * | 數(shù)據(jù)表 | SN65LVDS95-EP LVDS SERDES Transmitter 數(shù)據(jù)表 (Rev. A) | 2009年 9月 24日 | |||
| * | VID | SN65LVDS95-EP VID V6204643 | 2016年 6月 21日 |
設(shè)計(jì)與開發(fā)
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| 封裝 | 引腳 | CAD 符號(hào)、封裝和 3D 模型 |
|---|---|---|
| TSSOP (DGG) | 48 | Ultra Librarian |
訂購和質(zhì)量
- RoHS
- REACH
- 器件標(biāo)識(shí)
- 引腳鍍層/焊球材料
- MSL 等級(jí)/回流焊峰值溫度
- MTBF/時(shí)基故障估算
- 材料成分
- 鑒定摘要
- 持續(xù)可靠性監(jiān)測(cè)
- 制造廠地點(diǎn)
- 封裝廠地點(diǎn)