CD74HC40103-EP

正在供貨

高速 Cmos 邏輯 8 級同步減法計數(shù)器(增強型產(chǎn)品)

產(chǎn)品詳情

Function Counter Bits (#) 8 Technology family HC Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Input type Standard CMOS Output type Push-Pull Features Balanced outputs, High speed (tpd 10-50ns), Positive input clamp diode Operating temperature range (°C) -40 to 125 Rating HiRel Enhanced Product
Function Counter Bits (#) 8 Technology family HC Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Input type Standard CMOS Output type Push-Pull Features Balanced outputs, High speed (tpd 10-50ns), Positive input clamp diode Operating temperature range (°C) -40 to 125 Rating HiRel Enhanced Product
SOIC (D) 16 59.4 mm2 9.9 x 6
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –40°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • Synchronous or Asynchronous Preset
  • Cascadable in Synchronous or Ripple Mode
  • Fanout (Over Temperature Range)
    • Standard Outputs . . . 10 LSTTL Loads
    • Bus Driver Outputs . . . 15 LSTTL Loads
  • Balanced Propagation Delay and Transition Times
  • Significant Power Reduction Compared to LSTTL Logic ICs
  • VCC Voltage = 2 V to 6 V
  • High Noise Immunity NIL or NIH = 30% of VCC, VCC = 5 V

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –40°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • Synchronous or Asynchronous Preset
  • Cascadable in Synchronous or Ripple Mode
  • Fanout (Over Temperature Range)
    • Standard Outputs . . . 10 LSTTL Loads
    • Bus Driver Outputs . . . 15 LSTTL Loads
  • Balanced Propagation Delay and Transition Times
  • Significant Power Reduction Compared to LSTTL Logic ICs
  • VCC Voltage = 2 V to 6 V
  • High Noise Immunity NIL or NIH = 30% of VCC, VCC = 5 V

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The CD74HC40103 is manufactured with high-speed silicon-gate technology and consists of an 8-stage synchronous down counter with a single output, which is active when the internal count is zero. The device contains a single 8-bit binary counter. Each device has control inputs for enabling or disabling the clock, for clearing the counter to its maximum count, and for presetting the counter either synchronously or asynchronously. All control inputs and the terminal count (TC)\ output are active-low logic.

In normal operation, the counter is decremented by one count on each positive transition of the clock (CP) output. Counting is inhibited when the terminal enable (TE)\ input is high. TC\ goes low when the count reaches zero, if TE\ is low, and remains low for one full clock period.

When the synchronous preset enable (PE)\ input is low, data at the P0-P7 inputs are clocked into the counter on the next positive clock transition, regardless of the state of TE\. When the asynchronous preset enable (PL)\ input is low, data at the P0-P7 inputs asynchronously are forced into the counter, regardless of the state of the PE\, TE\, or CP inputs. Inputs P0-P7 represent a single 8-bit binary word for the CD74HC40103. When the master reset (MR)\ input is low, the counter asynchronously is cleared to its maximum count of 25510, regardless of the state of any other input. The precedence relationship between control inputs is indicated in the truth table.

If all control inputs except TE\ are high at the time of zero count, the counters jump to the maximum count, giving a counting sequence of 10016 or 25610 clock pulses long.

The CD74HC40103 may be cascaded using the TE\ input and the TC\ output in either synchronous or ripple mode. These circuits have the low power consumption usually associated with CMOS circuitry, yet have speeds comparable to low-power Schottky TTL circuits and can drive up to ten LSTTL loads.

The CD74HC40103 is manufactured with high-speed silicon-gate technology and consists of an 8-stage synchronous down counter with a single output, which is active when the internal count is zero. The device contains a single 8-bit binary counter. Each device has control inputs for enabling or disabling the clock, for clearing the counter to its maximum count, and for presetting the counter either synchronously or asynchronously. All control inputs and the terminal count (TC)\ output are active-low logic.

In normal operation, the counter is decremented by one count on each positive transition of the clock (CP) output. Counting is inhibited when the terminal enable (TE)\ input is high. TC\ goes low when the count reaches zero, if TE\ is low, and remains low for one full clock period.

When the synchronous preset enable (PE)\ input is low, data at the P0-P7 inputs are clocked into the counter on the next positive clock transition, regardless of the state of TE\. When the asynchronous preset enable (PL)\ input is low, data at the P0-P7 inputs asynchronously are forced into the counter, regardless of the state of the PE\, TE\, or CP inputs. Inputs P0-P7 represent a single 8-bit binary word for the CD74HC40103. When the master reset (MR)\ input is low, the counter asynchronously is cleared to its maximum count of 25510, regardless of the state of any other input. The precedence relationship between control inputs is indicated in the truth table.

If all control inputs except TE\ are high at the time of zero count, the counters jump to the maximum count, giving a counting sequence of 10016 or 25610 clock pulses long.

The CD74HC40103 may be cascaded using the TE\ input and the TC\ output in either synchronous or ripple mode. These circuits have the low power consumption usually associated with CMOS circuitry, yet have speeds comparable to low-power Schottky TTL circuits and can drive up to ten LSTTL loads.

下載 觀看帶字幕的視頻 視頻

技術(shù)文檔

star =有關此產(chǎn)品的 TI 精選熱門文檔
未找到結(jié)果。請清除搜索并重試。
查看全部 17
頂層文檔 類型 標題 格式選項 下載最新的英語版本 日期
* 數(shù)據(jù)表 CD74HC40103-EP 數(shù)據(jù)表 2003年 12月 4日
* 輻射與可靠性報告 CD74HC40103QM96EP Reliability Report 2016年 8月 9日
* VID CD74HC40103-EP VID V6204702 2016年 6月 21日
選擇指南 Logic Guide (Rev. AC) PDF | HTML 2025年 11月 13日
應用手冊 慢速或浮點 CMOS 輸入的影響 (Rev. E) PDF | HTML 英語版 (Rev.E) 2025年 3月 26日
應用手冊 Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015年 12月 2日
選擇指南 邏輯器件指南 2014 (Rev. AA) 最新英語版本 (Rev.AC) PDF | HTML 2014年 11月 17日
用戶指南 LOGIC Pocket Data Book (Rev. B) 2007年 1月 16日
應用手冊 Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004年 7月 8日
用戶指南 Signal Switch Data Book (Rev. A) 2003年 11月 14日
應用手冊 TI IBIS File Creation, Validation, and Distribution Processes 2002年 8月 29日
應用手冊 CMOS Power Consumption and CPD Calculation (Rev. B) 1997年 6月 1日
應用手冊 使用邏輯器件進行設計 (Rev. C) 1997年 6月 1日
應用手冊 Input and Output Characteristics of Digital Integrated Circuits 1996年 10月 1日
應用手冊 Live Insertion 1996年 10月 1日
應用手冊 SN54/74HCT CMOS Logic Family Applications and Restrictions 1996年 5月 1日
應用手冊 Using High Speed CMOS and Advanced CMOS in Systems With Multiple Vcc 1996年 4月 1日

設計與開發(fā)

如需其他信息或資源,請點擊以下任一標題進入詳情頁面查看(如有)。

封裝 引腳 CAD 符號、封裝和 3D 模型
SOIC (D) 16 Ultra Librarian

訂購和質(zhì)量

包含信息:
  • RoHS
  • REACH
  • 器件標識
  • 引腳鍍層/焊球材料
  • MSL 等級/回流焊峰值溫度
  • MTBF/時基故障估算
  • 材料成分
  • 鑒定摘要
  • 持續(xù)可靠性監(jiān)測
包含信息:
  • 制造廠地點
  • 封裝廠地點

支持和培訓

視頻