CD74HC08-EP

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4 通道、2 輸入、2V 至 6V 5.2mA 驅(qū)動強(qiáng)度與門（增強(qiáng)型產(chǎn)品）

產(chǎn)品詳情

Technology family HC Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Number of channels 4 Inputs per channel 2 IOL (max) (mA) 5.2 IOH (max) (mA) -5.2 Input type Standard CMOS Output type Push-Pull Features High speed (tpd 10- 50ns) Data rate (max) (Mbps) 28 Rating HiRel Enhanced Product Operating temperature range (°C) -40 to 125
Technology family HC Supply voltage (min) (V) 2 Supply voltage (max) (V) 6 Number of channels 4 Inputs per channel 2 IOL (max) (mA) 5.2 IOH (max) (mA) -5.2 Input type Standard CMOS Output type Push-Pull Features High speed (tpd 10- 50ns) Data rate (max) (Mbps) 28 Rating HiRel Enhanced Product Operating temperature range (°C) -40 to 125
SOIC (D) 14 51.9 mm2 8.65 x 6
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • Buffered Inputs
  • Typical Propagation Delay 7 ns at VCC = 5 V, CL = 15 pF, TA = 25°C
  • Fanout (Over Temperature Range)
    • Standard Outputs ... 10 LSTTL Loads
    • Bus Driver Outputs ... 15 LSTTL Loads
  • Balanced Propagation Delay and Transition Times
  • Significant Power Reduction Compared to LSTTL Logic ICs
  • 2-V to 6-V VCC Operation
  • High Noise Immunity NIL or NIH = 30% of VCC at VCC = 5 V
  • CMOS Input Compatibility, Il 1 μA at VOL, VOH

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • Buffered Inputs
  • Typical Propagation Delay 7 ns at VCC = 5 V, CL = 15 pF, TA = 25°C
  • Fanout (Over Temperature Range)
    • Standard Outputs ... 10 LSTTL Loads
    • Bus Driver Outputs ... 15 LSTTL Loads
  • Balanced Propagation Delay and Transition Times
  • Significant Power Reduction Compared to LSTTL Logic ICs
  • 2-V to 6-V VCC Operation
  • High Noise Immunity NIL or NIH = 30% of VCC at VCC = 5 V
  • CMOS Input Compatibility, Il 1 μA at VOL, VOH

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The CD74HC08 logic gates utilize silicon-gate CMOS technology to achieve operating speeds similar to LSTTL gates, with the low power consumption of standard CMOS integrated circuits. All devices can drive 10 LSTTL loads.

The CD74HC08 logic gates utilize silicon-gate CMOS technology to achieve operating speeds similar to LSTTL gates, with the low power consumption of standard CMOS integrated circuits. All devices can drive 10 LSTTL loads.
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類型 標(biāo)題 下載最新的英語版本 日期
* 數(shù)據(jù)表 CD74HC08-EP 數(shù)據(jù)表 (Rev. B) 2004年 4月 7日

訂購和質(zhì)量

包含信息：
  • RoHS
  • REACH
  • 器件標(biāo)識
  • 引腳鍍層/焊球材料
  • MSL 等級/回流焊峰值溫度
  • MTBF/時基故障估算
  • 材料成分
  • 鑒定摘要
  • 持續(xù)可靠性監(jiān)測
包含信息：
  • 制造廠地點(diǎn)
  • 封裝廠地點(diǎn)

支持和培訓(xùn)