產品詳情

Technology family CD4000 Number of channels 1 Operating temperature range (°C) -55 to 125 Rating Catalog Supply current (max) (μA) 3000
Technology family CD4000 Number of channels 1 Operating temperature range (°C) -55 to 125 Rating Catalog Supply current (max) (μA) 3000
PDIP (N) 16 181.42 mm2 19.3 x 9.4 SOP (NS) 16 79.56 mm2 10.2 x 7.8 TSSOP (PW) 16 32 mm2 5 x 6.4
  • High-output-sourcing capability............up to 25 mA
  • Input latches for BCD Code storage
  • Lamp Test and Blanking capability
  • 7-segment outputs blanked for BCD input codes > 1001
  • 100% tested for quiescent current at 20 V
  • Max. input current of 1 μA at 18 V, over full package-temperature range, 100 nA at 18 V and 25°C
  • 5-V, 10-V, and 15-V parametric ratings
  • Applications
    • Driving common-cathode LED displays
    • Multiplexing with common-cathode LED displays
    • Driving incandescent displays
    • Driving low-voltage fluorescent displays
  • High-output-sourcing capability............up to 25 mA
  • Input latches for BCD Code storage
  • Lamp Test and Blanking capability
  • 7-segment outputs blanked for BCD input codes > 1001
  • 100% tested for quiescent current at 20 V
  • Max. input current of 1 μA at 18 V, over full package-temperature range, 100 nA at 18 V and 25°C
  • 5-V, 10-V, and 15-V parametric ratings
  • Applications
    • Driving common-cathode LED displays
    • Multiplexing with common-cathode LED displays
    • Driving incandescent displays
    • Driving low-voltage fluorescent displays

CD4511B types are BCD-to-7-segment latch decoder drivers constructed with CMOS logic and n-p-n bipolar transistor output devices on a single monolithic structure. These devices combine the low quiescent power dissipation and high noise immunity features of RCA CMOS with n-p-n bipolar output transistors capable of sourcing up to 25 MA. This capability allows the CD4511B types to drive LED's and other displays directly.

Lamp Test (LT)\, Blanking (BL)\, and Latch Enable or Strobe inputs are provided to test the display, shut off or intensity-modulate it, and store or strobe a BCD code, respectively. Several different signals may be multiplexed and displayed when external multiplexing circuitry is used.

The CD4511B types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline packages (NSR suffix), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).

These devices are similar to the type MC14511.

CD4511B types are BCD-to-7-segment latch decoder drivers constructed with CMOS logic and n-p-n bipolar transistor output devices on a single monolithic structure. These devices combine the low quiescent power dissipation and high noise immunity features of RCA CMOS with n-p-n bipolar output transistors capable of sourcing up to 25 MA. This capability allows the CD4511B types to drive LED's and other displays directly.

Lamp Test (LT)\, Blanking (BL)\, and Latch Enable or Strobe inputs are provided to test the display, shut off or intensity-modulate it, and store or strobe a BCD code, respectively. Several different signals may be multiplexed and displayed when external multiplexing circuitry is used.

The CD4511B types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline packages (NSR suffix), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).

These devices are similar to the type MC14511.

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其他器件和數據表

該數據表適用于 CD4511B 和 CD4511B-MIL

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類型 標題 下載最新的英語版本 日期
* 數據表 CMOS BCD-to-7-Segment Latch Decoder Drivers 數據表 (Rev. B) 2003年 6月 27日
選擇指南 Logic Guide (Rev. AB) 2017年 6月 12日
應用手冊 Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 2015年 12月 2日
選擇指南 邏輯器件指南 2014 (Rev. AA) 最新英語版本 (Rev.AC) PDF | HTML 2014年 11月 17日
用戶指南 LOGIC Pocket Data Book (Rev. B) 2007年 1月 16日
應用手冊 Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 2004年 7月 8日
用戶指南 Signal Switch Data Book (Rev. A) 2003年 11月 14日
應用手冊 Understanding Buffered and Unbuffered CD4xxxB Series Device Characteristics 2001年 12月 3日
選擇指南 Logic Guide (Rev. AC) PDF | HTML 1994年 6月 1日

設計和開發

如需其他信息或資源,請點擊以下任一標題進入詳情頁面查看(如有)。

評估板

14-24-LOGIC-EVM — 采用 14 引腳至 24 引腳 D、DB、DGV、DW、DYY、NS 和 PW 封裝的邏輯產品通用評估模塊

14-24-LOGIC-EVM 評估模塊 (EVM) 設計用于支持采用 14 引腳至 24 引腳 D、DW、DB、NS、PW、DYY 或 DGV 封裝的任何邏輯器件。

用戶指南: PDF | HTML
英語版 (Rev.B): PDF | HTML
TI.com 上無現貨
參考設計

TIDA-00480 — 汽車類霍爾傳感器旋轉編碼器

這是一種增量式旋轉編碼器,使用非接觸式磁性感應來檢測旋轉速度和方向。兩個霍爾效應傳感器可測量 66 極環形磁體并輸出兩個正交信號。此汽車級解決方案具有低成本特點,由于使用固態檢測,不受物理磨損、污垢、腐蝕和射頻噪聲的影響,因此是用于取代常規機械接觸式編碼器的高可靠性產品。
用戶指南: PDF
原理圖: PDF
封裝 引腳 CAD 符號、封裝和 3D 模型
PDIP (N) 16 Ultra Librarian
SOP (NS) 16 Ultra Librarian
TSSOP (PW) 16 Ultra Librarian

訂購和質量

包含信息:
  • RoHS
  • REACH
  • 器件標識
  • 引腳鍍層/焊球材料
  • MSL 等級/回流焊峰值溫度
  • MTBF/時基故障估算
  • 材料成分
  • 鑒定摘要
  • 持續可靠性監測
包含信息:
  • 制造廠地點
  • 封裝廠地點

支持和培訓

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