數(shù)據(jù)表
CD4504B-EP
- Independence of Power-Supply Sequence Considerations – VCC Can Exceed VDD;
Input Signals Can Exceed Both VCC and VDD - Up and Down Level-Shifting Capability
- Shiftable Input Threshold for Either CMOS or TTL Compatibility
- Standardized Symmetrical Output Characteristics
- 100% Tested for Quiescent Current at 20 V
- Maximum Input Current of 1 μA at 18 V Over Full Package-Temperature Range:
100 nA at 18 V and 25°C - 5 V, 10 V, and 15 V Parametric Ratings
- Meets All Requirements of JEDEC Standard No. 13B,
"Standard Specifications for Description of ’B’ Series CMOS Devices" - SUPPORTS DEFENSE, AEROSPACE, AND MEDICAL APPLICATIONS
- Controlled Baseline
- One Assembly/Test Site
- One Fabrication Site
- Available in Military (–55°C/125°C) Temperature Range(1)
- Extended Product Life Cycle
- Extended Product-Change Notification
- Product Traceability
(1) Additional temperature ranges are available – contact factory
CD4504B hex voltage level-shifter consists of six circuits which shift input signals from the VCC logic level to the VDD logic level. To shift TTL signals to CMOS logic levels, the SELECT input is at the VCC HIGH logic state. When the SELECT input is at a LOW logic state, each circuit translates signals from one CMOS level to another.
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查看全部 2 | 類(lèi)型 | 標(biāo)題 | 下載最新的英語(yǔ)版本 | 日期 | |||
|---|---|---|---|---|---|---|
| * | 輻射與可靠性報(bào)告 | CD4504BMPWREP Reliability Report | 2012年 9月 12日 | |||
| * | 數(shù)據(jù)表 | CMOS Hex Voltage-Level Shifter for TTL-to-CMOS or CMOS-to-CMOS Operation 數(shù)據(jù)表 | 2008年 9月 3日 |
訂購(gòu)和質(zhì)量
包含信息:
- RoHS
- REACH
- 器件標(biāo)識(shí)
- 引腳鍍層/焊球材料
- MSL 等級(jí)/回流焊峰值溫度
- MTBF/時(shí)基故障估算
- 材料成分
- 鑒定摘要
- 持續(xù)可靠性監(jiān)測(cè)
包含信息:
- 制造廠地點(diǎn)
- 封裝廠地點(diǎn)