SBOK044B December   2020  – December 2024 TPS7H4010-SEP

1.   1
2. 1 Abstract
3.   Trademarks
4. 2 Introduction
5. 3 Single-Event Effects (SEE)
6. 4 Device and Test Board Information
7. 5 Irradiation Facility and Setup
8. 6 Depth, Range, and LETEFF Calculation
9. 7 Test Setup and Procedures
10. 8 Destructive Single-Event Effects (DSEE)
    1. 8.1 Single-Event Latch-up (SEL) Results
    2. 8.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
11. 9 Single-Event Transients (SET)
12. 10Event Rate Calculations
13. 11Summary
14. 12Revision History
15.   A Total Ionizing Dose from SEE Experiments
16.   B References

Single-Event Effects Test Report of the TPS7H4010-SEP Synchronous Step-Down Converter