SLVK152B August 2023 – November 2023 TPS7H2140-SEP
PRODUCTION DATA
HDR devices were stressed at 20 krad(Si) and 30 krad(Si) for biased and unbiased conditions.
| Total Samples: 10 | |
|---|---|
| Exposure Levels: | |
| 20 krad(Si) (5 samples) | 30 krad(Si) (5 samples) |
| 6, 7, 8, 9, 10 | 16, 17, 18, 19, 20 |
| Total Samples: 10 | |
|---|---|
| Exposure levels: | |
| 20 krad(Si) (5 samples) | 30 krad(Si) (5 samples) |
| 1, 2, 3, 4, 5 | 11, 12, 13, 14, 15 |
LDR devices were stressed at 20 krad(Si) and 30 krad(Si) for biased and unbiased conditions.
| Total Samples: 10 | |
|---|---|
| Exposure levels: | |
| 20 krad(Si) (5 samples) | 30 krad(Si) (5 samples) |
50, 51, 52, 53, 54 | 55, 56, 57, 58, 59 |
| Total Samples: 10 | |
|---|---|
| Exposure levels: | |
| 20 krad(Si) (5 samples) | 30 krad(Si) (5 samples) |
60, 61, 62, 63, 64 | 65, 66, 67, 68, 69 |