SLVK152B August 2023 – November 2023 TPS7H2140-SEP
PRODUCTION DATA
1.2 Device Details
Table 1-1 lists the device information used in the TID HDR characterization.
Table 1-1 Device and Exposure Details
| TID HDR and LDR Details | |
|---|---|
| Package | 28-pin HTSSOP (PWP) |
| TI part name | TPS7H2140MPWPTSEP |
| Device function | Quad-channel eFuse |
| Quantity tested | HDR :
|
| HDR radiation facility | Texas Instruments CLAB Dallas, Texas |
| LDR radiation facility | VPT Rad, Chelmsford, MA |
| HDR dose rate | 50-300-rad(Si)/s |
| LDR dose rate | 10mrad(Si)/s |
| Irradiation and test temperature | Ambient, room temperature controlled to 25°C ±6°C per MIL-STD-883 and MIL-STD-750 |
Figure 1-1 TPS7H2140-SEP Devices Used in Exposure (Front)
Figure 1-2 TPS7H2140-SEP Devices Used in Exposure (Back)