SLVK126C january 2023 – august 2023 TPS7H1111-SP
PRODUCTION DATA
1.2 Device Details
Table 1-1 lists the device information and test conditions used in the TID HDR and LDR characterization.
Table 1-1 Device and Exposure Details
| TID HDR and LDR Details | |
|---|---|
| TI Device | TPS7H1111-SP |
| TI Part Name | 5962R2120301VXC |
| Device Function | Low Dropout Linear Regulator |
| Package | 14-pin CFP (HBL) |
| Technology | LBC7 (Linear BiCMOS 7) |
| Assembly Lot Number | 2014109 |
| Quantity Tested |
HDR:
LDR:
|
| HDR Dose Rate | 50-300-rad(Si)/s
ionizing radiation with increments (1) |
| HDR Radiation Facility | Texas Instruments Dallas, Texas |
| LDR Dose Rate | 10mrad(Si)/s ionizing radiation with increments |
| LDR Radiation Facility | Radiation Test Solutions Colorado Springs, Colorado |
| Irradiation and Test Temperature | Ambient, room temperature controlled to 25°C ±6°C per MIL-STD-883 and MIL-STD-750. |
Figure 1-1 TPS7H1111-SP
Device (Front)
Figure 1-2 TPS7H1111-SP Device (Back)1. 100krad biased
and unbiased devices were annealed for 1 week at room temperature with their
respective bias conditions resulting in an effective dose rate of
165mrad(Si)/s.