SLVK086A january 2022 – may 2023 TPS7H4003-SEP
PRODUCTION DATA
- 1
- Single-Event Effects Test Report of the TPS7H4003-SEP Synchronous Step-Down Converter
- Trademarks
- 1 Introduction
- 2 Single-Event Effects (SEE)
- 3 Device and Test Board Information
- 4 Irradiation Facility and Setup
- 5 Depth, Range, and LETEFF Calculation
- 6 Test Setup and Procedures
- 7 Destructive Single-Event Effects (DSEE)
- 8 Single-Event Transients (SET)
- 9 Event Rate Calculations
- 10Summary
- A Appendix: Total Ionizing Dose From SEE Experiments
- B Appendix: References
- C Revision History
3 Device and Test Board Information
The TPS7H4003-SEP is packaged in a 44-pin plastic package as shown in Figure 3-1. The TPS7H4003 evaluation module was used to evaluate the performance and characteristics of the TPS7H4003-SEP under heavy-ions. Figure 3-2 shows the top view of the evaluation board used for the radiation testing. Figure 3-3 shows the EVM board schematic used for the heavy-ion testing campaign.
The package was delidded to reveal the die face for all heavy-ion testing.
Figure 3-1 Photograph of Delidded TPS7H4003-SEP [Left] and Pinout Diagram [Right]
Figure 3-2 TPS7H4003-SEP Board Top
View
Figure 3-3 TPS7H4003 Daughter Card Schematic