SLUAA93 November 2020 UCC28730-Q1
This section provides Functional Safety Failure In Time (FIT) rates for UCC28730-Q1 based on two different industry-wide used reliability standards:
| FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
|---|---|
| Total Component FIT Rate (50 mW, 100 mW, 150 mW) | 10, 11, 13 |
| Die FIT Rate (50 mW, 100 mW, 150 mW) | 3, 4, 5 |
| Package FIT Rate (50 mW, 100 mW, 150 mW) | 7, 7 , 8 |
The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
| Table | Category | Reference FIT Rate | Reference Virtual TJ |
|---|---|---|---|
| 5 | CMOS,
BICMOS Digital, analog / mixed | 25 FIT | 55°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.