SLLA530 December 2020 TCAN1145-Q1
This section provides Functional Safety Failure In Time (FIT) rates for the 14-pin SOIC (D), 14-pin VSON (DMT) and 14-pin SOT23 (DYY) packages of the TCAN1145-Q1 based on two different industry-wide used reliability standards:
| FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) 14-pin SOIC (D) | FIT (Failures Per 109 Hours) 14-pin VSON (DMT) | FIT (Failures Per 109 Hours) 14-pin SOT (DYY) |
|---|---|---|---|
| Total Component FIT Rate | 21 | 9 | 9 |
| Die FIT Rate | 5 | 3 | 5 |
| Package FIT Rate | 16 | 6 | 4 |
The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
| Table | Category | Reference FIT Rate | Reference Virtual TJ |
|---|---|---|---|
| 5 | CMOS, BICMOS Digital, analog/mixed | 60 FIT | 70°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.