J.L. Titus, G.H. Johnson, R.D. Schrimpf, K.F.
Galloway, "Single event burnout of power bipolar junction transistors," IEEE
Trans. on Nuclear Science, vol. NS-38, no. 6, pp. 1315-1322, 1991.
S. Kuboyama, T. Suzuki, T. Hirao and S. Matsuda,
"Mechanism for single-event burnout of bipolar transistors," in IEEE
Transactions on Nuclear Science, vol. 47, no. 6, pp. 2634-2639, Dec 2000.
M. K. Covo et al., "88-Inch Cyclotron: The
one-stop facility for electronics radiation testing," 2017 IEEE International
Workshop on Metrology for AeroSpace (MetroAeroSpace), Padua, 2017, pp.
484-488.
P. C. Adell, R. D. Schrimpf, B. K. Choi, W. T.
Holman, J. P. Attwood, C. R. Cirba, and K. F. Galloway, “Total-Dose and
Single-Event Effects in Switching DC/DC Power Converters,” IEEE Trans. Nucl.
Sci. Vol. 49(6), Dec. 2002, pp. 3217–3221.
R. L. Pease, “Modeling Single Event Transients in
Bipolar Linear Circuits,” IEEE Trans. Nucl. Sci., Vol. 55(4), Aug. 2008,
pp. 1879–1890.
R. Lveugle and A. Ammari, “Early SEU Fault
Injection in Digital, Analog and Mixed Signal Circuits: a Global Flow,” Proc. of
Design, Automation and Test in Europe Conf., 2004, pp. 1530–1591.
P. C. Adell, R. D. Schrimpf, B. K. Choi, W. T.
Holman, J. P. Attwood, C. R. Cirba, and K. F. Galloway, “Total-Dose and
Single-Event Effects in Switching DC/DC Power Converters,” IEEE Trans. Nucl.
Sci., Vol. 49(6), Dec. 2002, pp. 3217–3221.
D. Kececioglu, “Reliability and Life Testing
Handbook”, Vol. 1, PTR Prentice Hall, New Jersey,1993, pp. 186–193.