SFFSAG0 June 2025 TPS22950-Q1
The failure mode distribution estimation for TPS22950-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| VOUT open or Hi-Z | 30 |
| VOUT stuck on (VIN) | 15 |
| VOUT outside specification (voltage or rise time) | 30 |
| Current Protection limit outside specification | 10 |
| QOD stuck on | 5 |
| QOD stuck off | 5 |
| Pin to pin short (any two pins) | 5 |