SFFS816 March 2024 TMUX4051-Q1 , TMUX4052-Q1
4.1 TMUX4051-Q1: TSSOP and SOT-23-THIN Packages
Figure 4-4 and Figure 4-2 show the TMUX4051-Q1 pin diagram for the TSSOP and SOT-23-THIN packages. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TMUX405x-Q1 data sheet.
Figure 4-1 Pin Diagram (TSSOP) Package
Figure 4-2 Pin Diagram SOT-23-THIN PackageTable 4-2 Pin FMA for Device Pins
Short-Circuited to Ground
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| S4 | 1 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S6 | 2 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| D | 3 | Corruption of the signal passed onto the S pins. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S7 | 4 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S5 | 5 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| EN | 6 | EN stuck low. Can no longer disable the device without power down. | B |
| VSS | 7 | There is no effect; this is normal operation, if the switch path signal voltages are positive. Possible damage to the device if the switch path signal voltages are negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be possible. | A |
| GND | 8 | No effect, normal operation. | D |
| A2 | 9 | Address stuck low. Cannot control switch states. | B |
| A1 | 10 | Address stuck low. Cannot control switch states. | B |
| A0 | 11 | Address stuck low. Cannot control switch states. | B |
| S3 | 12 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S0 | 13 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S1 | 14 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S2 | 15 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| VDD | 16 | Device is unpowered. Device is not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be possible. | A |
Table 4-3 Pin FMA for Device
Open-Circuited
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| S4 | 1 | Corruption of the signal passed onto the D pin. | B |
| S6 | 2 | Corruption of the signal passed onto the D pin. | B |
| D | 3 | Corruption of the signal passed onto the S pins. | B |
| S7 | 4 | Corruption of the signal passed onto the D pin. | B |
| S5 | 5 | Corruption of the signal passed onto the D pin. | B |
| EN | 6 | Loss of control of the EN pin. Cannot turn off the device. | B |
| VSS | 7 | Device is unpowered and not functional. | B |
| GND | 8 | Device unpowered. Device not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| A2 | 9 | Control of the address pin is lost. Cannot control switch. | B |
| A1 | 10 | Control of the address pin is lost. Cannot control switch. | B |
| A0 | 11 | Control of the address pin is lost. Cannot control switch. | B |
| S3 | 12 | Corruption of the signal passed onto the D pin. | B |
| S0 | 13 | Corruption of the signal passed onto the D pin. | B |
| S1 | 14 | Corruption of the signal passed onto the D pin. | B |
| S2 | 15 | Corruption of the signal passed onto the D pin. | B |
| VDD | 16 | Device is unpowered. Device is not functional. | B |
Table 4-4 Pin FMA for Device Pins
Short-Circuited to Adjacent Pin
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|---|
| S4 | 1 | S6 | Possible corruption of the signal passed onto the D pin. | B |
| S6 | 2 | D | Possible corruption of the signal passed onto the SX and D pin. | B |
| D | 3 | S7 | Possible corruption of the signal passed onto the SX and D pin. | B |
| S7 | 4 | S5 | Possible corruption of the signal passed onto the D pin. | B |
| S5 | 5 | EN | Possible corruption of the signal passed onto the D pin. Switch state will be undefined. | B |
| EN | 6 | VSS | Possible damage to device if the signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be possible. | A |
| VSS | 7 | GND | Possible damage to device if the signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be possible. | A |
| GND | 8 | A2 | Not considered, corner pin. | D |
| A2 | 9 | A1 | Control of the address pin is lost. Cannot control switch. | B |
| A1 | 10 | A0 | Control of the address pin is lost. Cannot control switch. | B |
| A0 | 11 | S3 | Control of the address pin is lost. Cannot control switch. | B |
| S3 | 12 | S0 | Corruption of the signal passed onto the D pin. | B |
| S0 | 13 | S1 | Corruption of the signal passed onto the D pin. | B |
| S1 | 14 | S2 | Corruption of the signal passed onto the D pin. | B |
| S2 | 15 | VDD | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| VDD | 16 | S4 | Not considered, corner pin. | D |
Table 4-5 Pin FMA for Device Pins
Short-Circuited to VDD
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| S4 | 1 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S6 | 2 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| D | 3 | Corruption of the signal passed onto the S pins. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S7 | 4 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S5 | 5 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| EN | 6 | EN stuck high. Can no longer enable the device. | B |
| VSS | 7 | Device is unpowered and not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be possible. | A |
| GND | 8 | Device is unpowered. Device is not functional. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be possible. | A |
| A2 | 9 | Address stuck high. Cannot control switch. | B |
| A1 | 10 | Address stuck high. Cannot control switch. | B |
| A0 | 11 | Address stuck high. Cannot control switch. | B |
| S3 | 12 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S0 | 13 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S1 | 14 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S2 | 15 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| VDD | 16 | No effect, normal operation. | D |
Table 4-6 Pin FMA for Device Pins
Short-Circuited to VSS
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| S4 | 1 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S6 | 2 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| D | 3 | Corruption of the signal passed onto the S pins. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S7 | 4 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S5 | 5 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| EN | 6 | Possible damage to the device if the signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be possible. | A |
| VSS | 7 | No effect, normal operation. | D |
| GND | 8 | Possible damage to the device if signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage is possible. | A |
| A2 | 9 | Possible damage to the device if the signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be possible. | A |
| A1 | 10 | Possible damage to the device if the signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be possible. | A |
| A0 | 11 | Possible damage to the device if the signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be possible. | A |
| S3 | 12 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S0 | 13 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S1 | 14 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| S2 | 15 | Corruption of the signal passed onto the D pin. If there is no limiting resistor in the switch path, then device damage is possible. | A |
| VDD | 16 | Possible damage to the device if the signal voltage is negative. Observe that the absolute maximum ratings for all pins of the device are met, otherwise device damage may be possible. | A |