SFFS509 august 2023 TCAL9539-Q1
The failure mode distribution estimation for the TCAL9539-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| I2C control / communication error | 40 |
| I/O configuration error | 30 |
| I/O data bit error | 25 |
| INT false trip, fails to trip | 5 |