SFFS499 July 2025 LM5137-Q1
The failure mode distribution estimation for the LM5137-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| Output voltage not in specification | 45 |
| HO1/2 or LO1/2 gate driver stuck on, off or Hi-Z | 30 |
| No output voltage | 17 |
| Short circuit any two pins | 5 |
| PG1/2 – false trip or fails to trip | 3 |