SFFS363 January 2022 TMAG5123-Q1
The failure mode distribution estimation for the TMAG5123-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| Output stuck in HIGH state | 5 |
| Output stuck in LOW state | 25 |
| Output stuck in High-Z | 25 |
| Magnetic Threshold error (BOP or BRP out of specification) | 45 |