SFFS307 November 2021 LM5123-Q1
The failure mode distribution estimation for the LM5123-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| HO or LO gate driver stuck on | 10 |
| HO or LO gate driver stuck off | 20 |
| HO or LO gate driver open (high-Z) | 5 |
| VOUT voltage not in specification | 30 |
| PGOOD false trip or fails to trip | 35 |