TI uses ISO 26262-10, Figure 9 as the basis for all FMEDA calculations. Each of the rows in the FMEDA is given a portion of the overall device failure rate based on its transistor count or area (package FIT is calculated separately based on the number of device pins). Then based on the selections that are made in Section 2.2.3, the FMEDA will categorize the failure rate accordingly. The user can see the details of this categorization in the 'Details - ISO26262' tab.