SFFS086 August 2021 TLIN1039-Q1
The failure mode distribution estimation for the TLIN1039-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| Transmitter fail | 42% |
| Receiver fail | 6% |
| State control or I/O buffer fail | 14% |
| Global power control fail | 38% |